Title / AuthorYear
J Long, E Shelhamer, T Darrell
Proceedings of the IEEE conference on computer vision and pattern …
2015
W Liu, D Anguelov, D Erhan, C Szegedy, S Reed, CY Fu, AC Berg
European conference on computer vision, 21-37
2016
P Isola, JY Zhu, T Zhou, AA Efros
Proceedings of the IEEE conference on computer vision and pattern …
2017
LC Chen, G Papandreou, I Kokkinos, K Murphy, AL Yuille
IEEE transactions on pattern analysis and machine intelligence 40 (4), 834-848
2017
V Badrinarayanan, A Kendall, R Cipolla
IEEE transactions on pattern analysis and machine intelligence 39 (12), 2481 …
2017
F Yu, V Koltun
arXiv preprint arXiv:1511.07122
2015
M Cordts, M Omran, S Ramos, T Rehfeld, M Enzweiler, R Benenson, ...
Proceedings of the IEEE conference on computer vision and pattern …
2016
H Zhao, J Shi, X Qi, X Wang, J Jia
Proceedings of the IEEE conference on computer vision and pattern …
2017
J Dai, Y Li, K He, J Sun
Advances in neural information processing systems, 379-387
2016
H Noh, S Hong, B Han
Proceedings of the IEEE international conference on computer vision, 1520-1528
2015
HC Shin, HR Roth, M Gao, L Lu, Z Xu, I Nogues, J Yao, D Mollura, ...
IEEE transactions on medical imaging 35 (5), 1285-1298
2016
S Zheng, S Jayasumana, B Romera-Paredes, V Vineet, Z Su, D Du, ...
Proceedings of the IEEE international conference on computer vision, 1529-1537
2015
LA Gatys, AS Ecker, M Bethge
Proceedings of the IEEE conference on computer vision and pattern …
2016
A Oord, S Dieleman, H Zen, K Simonyan, O Vinyals, A Graves, ...
arXiv preprint arXiv:1609.03499
2016
LC Chen, Y Zhu, G Papandreou, F Schroff, H Adam
Proceedings of the European conference on computer vision (ECCV), 801-818
2018
D Eigen, R Fergus
Proceedings of the IEEE international conference on computer vision, 2650-2658
2015
X Wang, R Girshick, A Gupta, K He
Proceedings of the IEEE conference on computer vision and pattern …
2018
K Kamnitsas, C Ledig, VFJ Newcombe, JP Simpson, AD Kane, DK Menon, ...
Medical image analysis 36, 61-78
2017
R Girshick, J Donahue, T Darrell, J Malik
IEEE transactions on pattern analysis and machine intelligence 38 (1), 142-158
2015
G Lin, A Milan, C Shen, I Reid
Proceedings of the IEEE conference on computer vision and pattern …
2017
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Dates and citation counts are estimated and are determined automatically by a computer program.