| Title / Author | Year |
|---|---|
I Goodfellow, Y Bengio, A Courville MIT press | 2016 |
J Long, E Shelhamer, T Darrell Proceedings of the IEEE conference on computer vision and pattern … | 2015 |
R Girshick Proceedings of the IEEE international conference on computer vision, 1440-1448 | 2015 |
HC Shin, HR Roth, M Gao, L Lu, Z Xu, I Nogues, J Yao, D Mollura, ... IEEE transactions on medical imaging 35 (5), 1285-1298 | 2016 |
K Sohn, H Lee, X Yan Advances in neural information processing systems, 3483-3491 | 2015 |
G Cheng, P Zhou, J Han IEEE Transactions on Geoscience and Remote Sensing 54 (12), 7405-7415 | 2016 |
XX Zhu, D Tuia, L Mou, GS Xia, L Zhang, F Xu, F Fraundorfer IEEE Geoscience and Remote Sensing Magazine 5 (4), 8-36 | 2017 |
F Yu, V Koltun, T Funkhouser Proceedings of the IEEE conference on computer vision and pattern … | 2017 |
J Yang, MH Yang IEEE transactions on pattern analysis and machine intelligence 39 (3), 576-588 | 2016 |
K Sohn Advances in neural information processing systems, 1857-1865 | 2016 |
C Su, J Li, S Zhang, J Xing, W Gao, Q Tian Proceedings of the IEEE international conference on computer vision, 3960-3969 | 2017 |
L Mou, P Ghamisi, XX Zhu IEEE Transactions on Geoscience and Remote Sensing 55 (7), 3639-3655 | 2017 |
D Xu, Y Zhu, CB Choy, L Fei-Fei Proceedings of the IEEE conference on computer vision and pattern … | 2017 |
J Tian, J Hahner, C Becker, I Stepanov, K Rothermel Proceedings 35th Annual Simulation Symposium. SS 2002, 337-344 | 2002 |
C Su, S Zhang, J Xing, W Gao, Q Tian European conference on computer vision, 475-491 | 2016 |
KK Maninis, J Pont-Tuset, P Arbeláez, L Van Gool International conference on medical image computing and computer-assisted … | 2016 |
L Liu, W Ouyang, X Wang, P Fieguth, J Chen, X Liu, M Pietikäinen International journal of computer vision 128 (2), 261-318 | 2020 |
F Yu, D Wang, E Shelhamer, T Darrell Proceedings of the IEEE conference on computer vision and pattern … | 2018 |
P Li, D Wang, L Wang, H Lu Pattern Recognition 76, 323-338 | 2018 |
HF Yang, K Lin, CS Chen IEEE transactions on pattern analysis and machine intelligence 40 (2), 437-451 | 2017 |
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Dates and citation counts are estimated and are determined automatically by a computer program.