Articles citing Going Deeper With Convolutions
| Title / Author | Year |
|---|---|
A Krizhevsky, I Sutskever, GE Hinton Advances in neural information processing systems, 1097-1105 | 2012 |
K He, X Zhang, S Ren, J Sun Proceedings of the IEEE conference on computer vision and pattern … | 2016 |
K Simonyan, A Zisserman arXiv preprint arXiv:1409.1556 | 2014 |
IH Witten, E Frank Acm Sigmod Record 31 (1), 76-77 | 2002 |
Y LeCun, Y Bengio, G Hinton nature 521 (7553), 436-444 | 2015 |
S Ren, K He, R Girshick, J Sun Advances in neural information processing systems, 91-99 | 2015 |
S Ioffe, C Szegedy arXiv preprint arXiv:1502.03167 | 2015 |
O Russakovsky, J Deng, H Su, J Krause, S Satheesh, S Ma, Z Huang, ... International journal of computer vision 115 (3), 211-252 | 2015 |
I Goodfellow, Y Bengio, A Courville MIT press | 2016 |
J Long, E Shelhamer, T Darrell Proceedings of the IEEE conference on computer vision and pattern … | 2015 |
J Redmon, S Divvala, R Girshick, A Farhadi Proceedings of the IEEE conference on computer vision and pattern … | 2016 |
G Huang, Z Liu, L Van Der Maaten, KQ Weinberger Proceedings of the IEEE conference on computer vision and pattern … | 2017 |
J Schmidhuber Neural networks 61, 85-117 | 2015 |
W Liu, D Anguelov, D Erhan, C Szegedy, S Reed, CY Fu, AC Berg European conference on computer vision, 21-37 | 2016 |
M Abadi, P Barham, J Chen, Z Chen, A Davis, J Dean, M Devin, ... 12th {USENIX} symposium on operating systems design and implementation … | 2016 |
C Szegedy, V Vanhoucke, S Ioffe, J Shlens, Z Wojna Proceedings of the IEEE conference on computer vision and pattern … | 2016 |
K He, X Zhang, S Ren, J Sun Proceedings of the IEEE international conference on computer vision, 1026-1034 | 2015 |
F Schroff, D Kalenichenko, J Philbin Proceedings of the IEEE conference on computer vision and pattern … | 2015 |
K Xu, J Ba, R Kiros, K Cho, A Courville, R Salakhudinov, R Zemel, ... International conference on machine learning, 2048-2057 | 2015 |
LC Chen, G Papandreou, I Kokkinos, K Murphy, AL Yuille IEEE transactions on pattern analysis and machine intelligence 40 (4), 834-848 | 2017 |
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