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Linghuan Hu
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Genetic algorithm-based test generation for software product line with the integration of fault localization techniques
X Li, WE Wong, R Gao, L Hu, S Hosono
Empirical Software Engineering 23, 1-51, 2018
412018
How does combinatorial testing perform in the real world: an empirical study
L Hu, WE Wong, DR Kuhn, RN Kacker
Empirical Software Engineering 25, 2661-2693, 2020
322020
A survey of the inadequacies in traffic sign recognition systems for autonomous vehicles
AF Magnussen, N Le, L Hu, WE Wong
International Journal of Performability Engineering 16 (10), 1588, 2020
192020
Improving MC/DC and fault detection strength using combinatorial testing
D Li, L Hu, R Gao, WE Wong, DR Kuhn, RN Kacker
2017 IEEE International Conference on Software Quality, Reliability and …, 2017
182017
Effective test generation for combinatorial decision coverage
R Gao, L Hu, WE Wong, HL Lu, SK Huang
2016 IEEE International Conference on Software Quality, Reliability and …, 2016
132016
CT-IoT: a combinatorial testing-based path selection framework for effective IoT testing
L Hu, WE Wong, DR Kuhn, RN Kacker, S Li
Empirical Software Engineering 27, 1-38, 2022
82022
Improving software testing education via industry sponsored contests
WE Wong, L Hu, H Wang, Z Chen
2018 IEEE Frontiers in Education Conference (FIE), 1-5, 2018
72018
MCDC-Star: A white-box based automated test generation for high MC/DC coverage
L Hu, WE Wong, DR Kuhn, R Kacker
2018 5th International Conference on Dependable Systems and Their …, 2018
52018
Software-testing contests: Observations and lessons learned
X Wang, W Sun, L Hu, Y Zhao, WE Wong, Z Chen
Computer 52 (10), 61-69, 2019
22019
Estimation of the Total Number of Software Failures from Test Data and Code Coverage: A Bayesian Approach
HA Stieber, L Hu, WE Wong
2017 IEEE International Symposium on Software Reliability Engineering …, 2017
22017
Traditional Techniques for Software Fault Localization
Y Li, L Hu, WE Wong, V Debroy, D Li
Handbook of Software Fault Localization: Foundations and Advances, 119-133, 2023
2023
On Combinatorial Design-based Test Generation
L Hu
2021
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