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- Makoto NagataProfessor, Kobe UniversityVerified email at cs.kobe-u.ac.jp
- Takayasu SakuraiUniversity of TokyoVerified email at iis.u-tokyo.ac.jp
- Daisuke FujimotoNara Institute of Science and TechnologyVerified email at is.naist.jp
- Yu-ichi HAYASHINara Institute of Science and TechnologyVerified email at is.naist.jp
- Takuji MikiKobe UniversityVerified email at port.kobe-u.ac.jp
- Kazuo SakiyamaThe University of Electro-CommunicationsVerified email at uec.ac.jp
- Naofumi HommaTohoku UniversityVerified email at riec.tohoku.ac.jp
- Kohei MatsudaKobe UniversityVerified email at cs26.scitec.kobe-u.ac.jp
- Kiichi NiitsuKyoto UniversityVerified email at i.kyoto-u.ac.jp
- Jean-Luc DangerLTCI, Télécom Paris, Institut Polytechnique de ParisVerified email at enst.fr
- Shivam BhasinNTU SingaporeVerified email at ntu.edu.sg
- Hideharu AmanoKeio UniversityVerified email at am.ics.keio.ac.jp
- Hiroki MatsutaniDept of ICS, Keio UniversityVerified email at arc.ics.keio.ac.jp
- Yusmeeraz YusofUniversiti Teknologi MalaysiaVerified email at utm.my
- Takeshi SugawaraThe University of Electro-CommunicationsVerified email at uec.ac.jp
- Hayun ChungAssistant Professor of Electronics and Information Engineering, Korea UniversityVerified email at korea.ac.kr
- Jakub BreierSenior Cybersecurity Manager, TTControl GmbH, Vienna, AustriaVerified email at ttcontrol.com
- Zakaria NajmResearch Associate,NTU SingaporeVerified email at ntu.edu.sg
- Lan NanQualcomm Technologies Inc./ University of California, Los AngelesVerified email at ee.ucla.edu
- Won-Joo (Ryan) YunCorporate VP, Samsung ElectronicsVerified email at samsung.com