| Inductive fault analysis of MOS integrated circuits JP Shen, W Maly, FJ Ferguson IEEE Design & Test of Computers 2 (6), 13-26, 1985 | 655 | 1985 |
| Extraction and simulation of realistic CMOS faults using inductive fault analysis FJ Ferguson, JP Shen Proc. Int. Test Conf, 475-484, 1988 | 316 | 1988 |
| Defect classes-an overdue paradigm for CMOS IC testing CF Hawkins, JM Soden, AW Righter, FJ Ferguson Proceedings., International Test Conference, 413-425, 1995 | 272 | 1995 |
| A CMOS fault extractor for inductive fault analysis FJ Ferguson, JP Shen IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 1988 | 268 | 1988 |
| Carafe: An inductive fault analysis tool for CMOS VLSI circuits A Jee, FJ Ferguson Digest of Papers Eleventh Annual 1993 IEEE VLSI Test Symposium, 92-98, 1993 | 236 | 1993 |
| Test pattern generation for realistic bridge faults in CMOS ICs FJ Ferguson, T Larrabee University of California, Santa Cruz, Computer Research Laboratory, 1991 | 199 | 1991 |
| Systematic characterization of physical defects for fault analysis of MOS IC cells W Maly, FJ Ferguson, JP Shen Proceedings of the 1984 international test conference on The three faces of …, 1984 | 155 | 1984 |
| The design of easily testable VLSI array multipliers Shen, Ferguson IEEE Transactions on Computers 100 (6), 554-560, 1984 | 139 | 1984 |
| Testing for parametric faults in static CMOS circuits FJ Ferguson, M Taylor, T Larrabee Proceedings. International Test Conference 1990, 436-443, 1990 | 120 | 1990 |
| Diagnosing realistic bridging faults with single stuck-at information DB Lavo, B Chess, T Larrabee, FJ Ferguson IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 1998 | 79 | 1998 |
| Diagnosis of realistic bridging faults with single stuck-at information B Chess, DB Lavo, FJ Ferguson, T Larrabee Proceedings of IEEE International Conference on Computer Aided Design (ICCAD …, 1995 | 78 | 1995 |
| Testing CMOS logic gates for: Realistic shorts B Chess, A Freitas, FJ Ferguson, T Larrabee Proceedings., International Test Conference, 395-402, 1995 | 54 | 1995 |
| On state reduction of incompletely specified finite state machines S Gören, FJ Ferguson Computers & Electrical Engineering 33 (1), 58-69, 2007 | 47 | 2007 |
| Oscillation and sequential behavior caused by interconnect opens in digital CMOS circuits H Konuk, FJ Ferguson Proceedings International Test Conference 1997, 597-606, 1997 | 39 | 1997 |
| Bridging fault diagnosis in the absence of physical information DB Lavo, B Chess, T Larrabee, FJ Ferguson, J Saxena, KM Butler Proceedings International Test Conference 1997, 887-893, 1997 | 38 | 1997 |
| An unexpected factor in testing for CMOS opens: The die surface H Konuk, FJ Ferguson Proceedings of 14th VLSI Test Symposium, 422-429, 1996 | 37 | 1996 |
| On applying non-classical defect models to automated diagnosis J Saxena, KM Butler, H Balachandran, DB Lavo, B Chess, T Larrabee, ... Proceedings International Test Conference 1998 (IEEE Cat. No. 98CH36270 …, 1998 | 36 | 1998 |
| Method for diagnosing bridging faults in integrated circuits FJ Ferguson, T Larabee, B Chess, DB Lavo US Patent 6,560,736, 2003 | 35 | 2003 |
| Method for diagnosing bridging faults in integrated circuits FJ Ferguson, T Larabee, B Chess, DB Lavo US Patent 6,202,181, 2001 | 33 | 2001 |
| Carafe: An inductive fault analysis tool for CMOS VLSI circuits AL Jee University of California at Santa Cruz, 1991 | 31 | 1991 |
