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Patrick Fiorenza
Patrick Fiorenza
Consiglio Nazionale delle Ricerche - Insituto per la Microelettronica e Microsistemi, Catania Italia
Verified email at imm.cnr.it
Title
Cited by
Cited by
Year
Emerging trends in wide band gap semiconductors (SiC and GaN) technology for power devices
F Roccaforte, P Fiorenza, G Greco, RL Nigro, F Giannazzo, F Iucolano, ...
Microelectronic Engineering 187, 66-77, 2018
4052018
An overview of normally-off GaN-based high electron mobility transistors
F Roccaforte, G Greco, P Fiorenza, F Iucolano
Materials 12 (10), 1599, 2019
2332019
Recent advances on dielectrics technology for SiC and GaN power devices
F Roccaforte, P Fiorenza, G Greco, M Vivona, RL Nigro, F Giannazzo, ...
Applied Surface Science 301, 9-18, 2014
1702014
Challenges for energy efficient wide band gap semiconductor power devices
F Roccaforte, P Fiorenza, G Greco, RL Nigro, F Giannazzo, A Patti, ...
physica status solidi (a) 211 (9), 2063-2071, 2014
1322014
Non-stoichiometry in “CaCu 3 Ti 4 O 12”(CCTO) ceramics
R Schmidt, S Pandey, P Fiorenza, DC Sinclair
RSC advances 3 (34), 14580-14589, 2013
1072013
SiO2/4H-SiC interface doping during post-deposition-annealing of the oxide in N2O or POCl3
P Fiorenza, F Giannazzo, M Vivona, A La Magna, F Roccaforte
Applied Physics Letters 103 (15), 2013
942013
Characterization of SiO2/4H-SiC Interfaces in 4H-SiC MOSFETs: A Review
P Fiorenza, F Giannazzo, F Roccaforte
Energies 12 (12), 2310, 2019
922019
Limiting mechanism of inversion channel mobility in Al-implanted lateral 4H-SiC metal-oxide semiconductor field-effect transistors
A Frazzetto, F Giannazzo, P Fiorenza, V Raineri, F Roccaforte
Applied Physics Letters 99 (7), 2011
792011
Critical issues for interfaces to p-type SiC and GaN in power devices
F Roccaforte, A Frazzetto, G Greco, F Giannazzo, P Fiorenza, RL Nigro, ...
Applied Surface Science 258 (21), 8324-8333, 2012
722012
Correlating macroscopic and nanoscale electrical modifications of SiO2/4H-SiC interfaces upon post-oxidation-annealing in N2O and POCl3
LK Swanson, P Fiorenza, F Giannazzo, A Frazzetto, F Roccaforte
Applied Physics Letters 101 (19), 2012
662012
Fowler-Nordheim tunneling at SiO2/4H-SiC interfaces in metal-oxide-semiconductor field effect transistors
P Fiorenza, A Frazzetto, A Guarnera, M Saggio, F Roccaforte
Applied Physics Letters 105 (14), 2014
622014
Localized electrical characterization of the giant permittivity effect in CaCu3Ti4O12 ceramics
P Fiorenza, R Lo Nigro, C Bongiorno, V Raineri, MC Ferarrelli, ...
Applied Physics Letters 92 (18), 2008
612008
Conductive atomic force microscopy studies of thin SiO2 layer degradation
P Fiorenza, W Polspoel, W Vandervorst
Applied physics letters 88 (22), 2006
602006
Comparative study of gate oxide in 4H-SiC lateral MOSFETs subjected to post-deposition-annealing in N2O and POCl3
P Fiorenza, LK Swanson, M Vivona, F Giannazzo, C Bongiorno, ...
Applied Physics A 115, 333-339, 2014
472014
Channel Mobility in GaN Hybrid MOS-HEMT Using SiO2as Gate Insulator
P Fiorenza, G Greco, F Iucolano, A Patti, F Roccaforte
IEEE Transactions on Electron Devices 64 (7), 2893-2899, 2017
462017
Epitaxial NiO gate dielectric on AlGaN/GaN heterostructures
F Roccaforte, G Greco, P Fiorenza, V Raineri, G Malandrino, R Lo Nigro
Applied Physics Letters 100 (6), 2012
462012
Interface Electrical Properties of Al2O3 Thin Films on Graphene Obtained by Atomic Layer Deposition with an in Situ Seedlike Layer
G Fisichella, E Schiliro, S Di Franco, P Fiorenza, R Lo Nigro, F Roccaforte, ...
ACS applied materials & interfaces 9 (8), 7761-7771, 2017
452017
Negative charge trapping effects in Al2O3 films grown by atomic layer deposition onto thermally oxidized 4H-SiC
E Schilirò, R Lo Nigro, P Fiorenza, F Roccaforte
AIP Advances 6 (7), 2016
452016
Micro-and nanoscale electrical characterization of large-area graphene transferred to functional substrates
G Fisichella, S Di Franco, P Fiorenza, RL Nigro, F Roccaforte, C Tudisco, ...
Beilstein journal of nanotechnology 4 (1), 234-242, 2013
442013
Physics and technology of gallium nitride materials for power electronics
F Roccaforte, P Fiorenza, R Lo Nigro, F Giannazzo, G Greco
LA RIVISTA DEL NUOVO CIMENTO 41 (12), 625-681, 2018
432018
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