| Thermal stability and crystallization kinetics of sputtered amorphous Si3N4 films H Schmidt, W Gruber, G Borchardt, M Bruns, M Rudolphi, H Baumann Thin Solid Films 450 (2), 346-351, 2004 | 66 | 2004 |
| Field emission properties of self-assembled silicon nanostructures on n-and p-type silicon S Johnson, A Markwitz, M Rudolphi, H Baumann, SP Oei, KBK Teo, ... Applied Physics Letters 85 (15), 3277-3279, 2004 | 65 | 2004 |
| Nanostructuring of silicon (100) using electron beam rapid thermal annealing S Johnson, A Markwitz, M Rudolphi, H Baumann Journal of Applied Physics 96 (1), 605-609, 2004 | 57 | 2004 |
| Determining a critical strain for APS thermal barrier coatings under service relevant loading conditions H Aleksanoglu, A Scholz, M Oechsner, C Berger, M Rudolphi, M Schütze, ... International journal of fatigue 53, 40-48, 2013 | 36 | 2013 |
| Evolution of microstructure and mechanical properties of NiAl-diffusion coatings after thermocyclic exposure C Oskay, M Rudolphi, EE Affeldt, M Schütze, MC Galetz Intermetallics 89, 22-31, 2017 | 31 | 2017 |
| Formation of SiC-surface nanocrystals by ion implantation and electron beam rapid thermal annealing A Markwitz, S Johnson, M Rudolphi, H Baumann, A Mücklich Applied Physics Letters 86 (1), 2005 | 25 | 2005 |
| Effect of crystal orientation on self-assembled silicon nanostructures formed by electron-beam annealing S Johnson, A Markwitz, M Rudolphi, H Baumann, PY Kuo, R Blaikie, ... Journal of applied physics 97 (9), 2005 | 22 | 2005 |
| Nitrogen self-diffusion in silicon nitride thin films probed with isotope heterostructures H Schmidt, G Borchardt, M Rudolphi, H Baumann, M Bruns Applied physics letters 85 (4), 582-584, 2004 | 22 | 2004 |
| Investigations for the validation of the defect based scale failure diagrams—part I: nickel oxide M Rudolphi, M Schütze Oxidation of metals 79, 167-177, 2013 | 20 | 2013 |
| Field emission properties of self-assembled silicon nanostructures formed by electron beam annealing S Johnson, A Markwitz, M Rudolphi, H Baumann, SP Oei, KBK Teo, ... Current Applied Physics 6 (3), 503-506, 2006 | 20 | 2006 |
| Verification of moisture-induced delayed failure of thermal barrier coatings M Rudolphi, D Renusch, M Schütze Scripta Materialia 59 (2), 255-257, 2008 | 19 | 2008 |
| SiC nanoboulders on silicon–a nuclear reaction analysis study of low energy 13C implanted and subsequently electron beam annealed (1 0 0) silicon A Markwitz, VJ Kennedy, S Johnson, WJ Trompetter, M Rudolphi, ... Nuclear Instruments and Methods in Physics Research Section B: Beam …, 2004 | 19 | 2004 |
| Fireside corrosion of chromium-and aluminum-coated ferritic–martensitic steels D Fähsing, M Rudolphi, L Konrad, MC Galetz Oxidation of Metals 88, 155-164, 2017 | 18 | 2017 |
| Simultaneous formation of SiC and Si nanostructures on silicon by local ion implantation and electron beam annealing A Markwitz, S Johnson, M Rudolphi Applied physics letters 89 (15), 2006 | 15 | 2006 |
| High purity Si–C–N thin films with tailored composition on the tie line SiC–Si3N4 M Rudolphi, M Bruns, H Baumann, U Geckle Diamond and related materials 16 (4-7), 1273-1277, 2007 | 14 | 2007 |
| The diffusion of ion implanted hydrogen in amorphous Si3N4: H films H Schmidt, W Gruber, G Borchardt, M Bruns, M Rudolphi, H Baumann Journal of Physics: Condensed Matter 16 (24), 4233, 2004 | 14 | 2004 |
| Investigations for the validation of the defect based scale failure diagrams—Part II: extension of the concept and application to nickel oxide, titanium oxide and iron oxide M Rudolphi, M Schütze Oxidation of Metals 84, 45-60, 2015 | 13 | 2015 |
| Prediction of mechanical scale failure–current status and perspectives M Schütze, M Rudolphi Materials Science Forum 696, 138-143, 2011 | 11 | 2011 |
| Formation of large SiC nanocrystals on Si (1 0 0) by 12C implantation and electron beam annealing A Markwitz, S Johnson, J Kennedy, M Rudolphi, H Baumann Current Applied Physics 6 (3), 507-510, 2006 | 11 | 2006 |
| Patterned growth of self-assembled silicon nanostructures by ion implantation and electron beam annealing S Johnson, A Markwitz, M Rudolphi, H Baumann Journal of Vacuum Science & Technology B: Microelectronics and Nanometer …, 2005 | 11 | 2005 |
