Forecasting flow time in semiconductor manufacturing using knowledge discovery in databases I Tirkel International Journal of Production Research 51 (18), 5536-5548, 2013 | 49 | 2013 |
Modeling cost benefit analysis of inspection in a production line I Tirkel, G Rabinowitz International Journal of Production Economics 147, 38-45, 2014 | 39 | 2014 |
In-line inspection impact on cycle time and yield I Tirkel, N Reshef, G Rabinowitz IEEE Transactions on Semiconductor Manufacturing 22 (4), 491-498, 2009 | 35 | 2009 |
Yield learning curve models in semiconductor manufacturing I Tirkel IEEE transactions on semiconductor manufacturing 26 (4), 564-571, 2013 | 33 | 2013 |
Cycle time prediction in wafer fabrication line by applying data mining methods I Tirkel 2011 IEEE/SEMI Advanced Semiconductor Manufacturing Conference, 1-5, 2011 | 31 | 2011 |
The effectiveness of variability reduction in decreasing wafer fabrication cycle time I Tirkel 2013 Winter Simulations Conference (WSC), 3796-3805, 2013 | 21 | 2013 |
Wafer fabrication yield learning and cost analysis based on in-line inspection I Tirkel, G Rabinowitz, D Price, D Sutherland International Journal of Production Research 54 (12), 3578-3590, 2016 | 19 | 2016 |
The relationship between yield and flow time in a production system under inspection I Tirkel, G Rabinowitz International Journal of Production Research 50 (14), 3686-3697, 2012 | 17 | 2012 |
The efficiency of inspection based on out of control detection in wafer fabrication I Tirkel Computers & Industrial Engineering 99, 458-464, 2016 | 13 | 2016 |
Approximation of single-class queueing networks with downtime-induced traffic variability R Sagron, D Grosbard, G Rabinowitz, I Tirkel International Journal of Production Research 53 (13), 3871-3887, 2015 | 10 | 2015 |
A queuing network model for wafer fabrication using decomposition without aggregation D Grosbard, A Kalir, I Tirkel, G Rabinowitz 2013 IEEE International Conference on Automation Science and Engineering …, 2013 | 9 | 2013 |
Quality performance modeling in a deteriorating production system with partially available inspection I Tirkel, G Rabinowitz Operations Research Proceedings 2010: Selected Papers of the Annual …, 2011 | 6 | 2011 |
Approximating class-departure variability in tandem queues with downtime events: Regression-based variability function R Sagron, G Rabinowitz, I Tirkel Computers & Operations Research 88, 161-174, 2017 | 5 | 2017 |
Scheduling preventive maintenance within a queue time for maximum throughput in semiconductor manufacturing AA Kalir, I Tirkel 2016 Winter Simulation Conference (WSC), 2750-2761, 2016 | 4 | 2016 |
New LST of inter-departure times in PH/G/1 queue, and extensions to ME/G/1 and G/G/1 queues R Sagron, Y Kerner, G Rabinowitz, I Tirkel Computers & Industrial Engineering 135, 518-527, 2019 | 3 | 2019 |
Identification of statistical distributions for cycle time in wafer fabrication I Tirkel, Y Parmet IEEE Transactions on Semiconductor Manufacturing 30 (1), 90-97, 2016 | 2 | 2016 |
Throughput and flow-time in a production line with partial machine availability and imperfect quality processing M Eyal, I Tirkel 2015 Winter Simulation Conference (WSC), 3144-3145, 2015 | | 2015 |
Optimized inspection capacity for out of control detection in semiconductor manufacturing I Tirkel Proceedings of the 2012 Winter Simulation Conference (WSC), 1-8, 2012 | | 2012 |
Integrative Consideration of Cycle Time and Yield for In-line Inspection Scheduling I Tirkel Ben Gurion University of the Negev, 2011 | | 2011 |
Modeling Quality versus Flow Time due to Inspections I Tirkel | | |