Wieslaw Kuzmicz
Wieslaw Kuzmicz
Verified email at imio.pw.edu.pl
Cited by
Cited by
Twin gate, vertical slit FET (VeSFET) for highly periodic layout and 3D integration
W Maly, N Singh, Z Chen, N Shen, X Li, A Pfitzner, D Kasprowicz, ...
Proceedings of the 18th International Conference Mixed Design of Integrated …, 2011
Ionization of impurities in silicon
W Kuzmicz
Solid-state electronics 29 (12), 1223-1227, 1986
CMOS standard cells characterization for defect based testing
WA Pleskacz, D Kasprowicz, T Oleszczak, W Kuzmicz
Proceedings 2001 IEEE International Symposium on Defect and Fault Tolerance …, 2001
Coupling a statistical process-device simulator with a circuit layout extractor for a realistic circuit simulation of VLSI circuits
W Kuźmicz, W Denisiuk, J Gempel, Z Jaworski, M Niewczas, A Pfitzner, ...
Simulation of Semiconductor Devices and Processes, 37-40, 1993
Extension of inductive fault analysis to parametric faults in analog circuits with application to test generation
Z Jaworski, M Niewczas, W Kuzmicz
Proceedings. 15th IEEE VLSI Test Symposium (Cat. No. 97TB100125), 172-176, 1997
Defect-oriented fault simulation and test generation in digital circuits
W Kuzmicz, W Pleskacz, J Raik, R Ubar
Proceedings of the IEEE 2001. 2nd International Symposium on Quality …, 2001
Fuzzy logic controller for rate-adaptive heart pacemaker
A Wojtasik, Z Jaworski, W Kuźmicz, A Wielgus, A Wałkanis, D Sarna
Applied Soft Computing 4 (3), 259-270, 2004
Hierarchical defect-oriented fault simulation for digital circuits
M Blyzniuk, T Cibakova, E Gramatova, W Kuzmicz, M Lobur, W Pleskacz, ...
Proceedings IEEE European Test Workshop, 69-74, 2000
Static power consumption in nano-cmos circuits: Physics and modelling
W Kuzmicz, E Piwowarska, A Pfitzner, D Kasprowicz
2007 14th International Conference on Mixed Design of Integrated Circuits …, 2007
Probabilistic analysis of CMOS physical defects in VLSI circuits for test coverage improvement
M Blyzniuk, I Kazymyra, W Kuzmicz, WA Pleskacz, J Raik, R Ubar
Microelectronics Reliability 41 (12), 2023-2040, 2001
Fuzzy logic-based diagnostic algorithm for implantable cardioverter defibrillators
A Bárdossy, A Blinowska, W Kuzmicz, J Ollitrault, M Lewandowski, ...
Artificial intelligence in medicine 60 (2), 113-121, 2014
DOT: New deterministic defect-oriented ATPG tool
J Raik, R Ubar, J Sudbrock, W Kuzmicz, W Pleskacz
European Test Symposium (ETS'05), 96-101, 2005
Hierarchical test generation for combinational circuits with real defects coverage
T Cibakova, M Fischerová, E Gramatová, W Kuzmicz, WA Pleskacz, ...
Microelectronics Reliability 42 (7), 1141-1149, 2002
Resistive Plate Chamber (RPC) based muon trigger system for the CMS experiment–pattern comparator ASIC
Z Jaworski, IM Kudla, W Kuzmicz, M Niewczas
Nuclear Instruments and Methods in Physics Research Section A: Accelerators …, 1998
Statistical many-dimensional simulation of VLSI technology based on response surface methodology
MV Kazitov, WB Kuzmicz, VV Nelayev, VR Stempitsky
Third International Workshop on Nondestructive Testing and Computer …, 2000
Estimation of probability of different functional faults caused by spot defects in VLSI circuits
M Blyzniuk, W Pleskacz, M Lobur, W Kuzmicz
Proc. International Conference on Modern Problems of Telecommunications …, 2000
Heavy doping parameters estimated from transistor measurements
W Kuzmicz, W Zagozdzon-Wosik
Solid-state electronics 31 (5), 911-919, 1988
Defect-oriented test-and layout-generation for standard-cell ASIC designs
J Sudbrock, J Raik, R Ubar, W Kuzmicz, W Pleskacz
Digital System Design, 2005. Proceedings. 8th Euromicro Conference on, 79-82, 2005
Defect-oriented library builder and hierarchical test generation
T Cibakova, E Gramatova, W Kuzmicz, W Pleskacz, J Raik, R Ubar
Proc. of DDECS 1, 18-20, 2001
VLSI implementations of fuzzy logic controllers for rate-adaptive pacemakers, Annual Intemational IEEE-EMBS Special Topic Conference on Microtechnologies in Medicine and Biology
Z Jaworski, W Kuzmicz, M Sadowski, D Sama, A Walkanis, A Wielgus, ...
Annual International Conference,(Oct 2000), 475-478, 2000
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