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Eitan Farchi
Eitan Farchi
IBM Research Lab in Haifa
Verified email at il.ibm.com
Title
Cited by
Cited by
Year
Concurrent bug patterns and how to test them
E Farchi, Y Nir, S Ur
Proceedings international parallel and distributed processing symposium, 7 pp., 2003
3082003
Static index pruning for information retrieval systems
D Carmel, D Cohen, R Fagin, E Farchi, M Herscovici, YS Maarek, A Soffer
Proceedings of the 24th annual international ACM SIGIR conference on …, 2001
3042001
Multithreaded Java program test generation
O Edelstein, E Farchi, Y Nir, G Ratsaby, S Ur
IBM systems journal 41 (1), 111-125, 2002
2842002
Framework for testing multi‐threaded Java programs
O Edelstein, E Farchi, E Goldin, Y Nir, G Ratsaby, S Ur
Concurrency and Computation: Practice and Experience 15 (3‐5), 485-499, 2003
1802003
Using a model-based test generator to test for standard conformance
E Farchi, A Hartman, SS Pinter
IBM systems journal 41 (1), 89-110, 2002
1662002
Using binary decision diagrams for combinatorial test design
I Segall, R Tzoref-Brill, E Farchi
Proceedings of the 2011 International Symposium on Software Testing and …, 2011
1262011
Automatic query wefinement using lexical affinities with maximal information gain
D Carmel, E Farchi, Y Petruschka, A Soffer
Proceedings of the 25th annual international ACM SIGIR conference on …, 2002
1202002
Applications of synchronization coverage
A Bron, E Farchi, Y Magid, Y Nir, S Ur
Proceedings of the tenth ACM SIGPLAN symposium on Principles and practice of …, 2005
1192005
Automatic query refinement
D Carmel, E Farchi, Y Petruschka
US Patent 6,941,297, 2005
862005
Method and apparatus for collecting persistent coverage data across software versions
E Farchi, T Pavela, S Ur, A Ziv
US Patent App. 09/990,802, 2003
832003
Optimal search in trees
Y Ben-Asher, E Farchi, I Newman
SIAM Journal on Computing 28 (6), 2090-2102, 1999
811999
Method and system for integrating test coverage measurements with model based test generation
E Farchi, D Geist, A Hartman, P Kram, K Nagin, Y Shaham-Gafni, S Ur
US Patent 7,272,752, 2007
742007
Race detection for parallel software
S Ur, E Farchi, G Ratsaby
US Patent 6,851,075, 2005
742005
Heuristics for finding concurrent bugs
Y Eytani, E Farchi, Y Ben-Asher
Proceedings International Parallel and Distributed Processing Symposium, 8 pp., 2003
642003
Lossy index compression
D Carmel, D Cohen, R Fagin, E Farchi, M Herscovici, Y Maarek, A Soffer
US Patent 7,356,527, 2008
612008
Detection of data drift and outliers affecting machine learning model performance over time
S Ackerman, E Farchi, O Raz, M Zalmanovici, P Dube
arXiv preprint arXiv:2012.09258, 2020
552020
Detection of deadlock potentials in multithreaded programs
R Agarwal, S Bensalem, E Farchi, K Havelund, Y Nir-Buchbinder, ...
IBM Journal of Research and Development 54 (5), 3: 1-3: 15, 2010
462010
Caching in a data processing system using the pigeon hole principle
ME Factor, ED Farchi
US Patent 6,094,706, 2000
462000
Evaluation of software based on review history
ED Farchi, S Novikov, O Raz-Pelleg
US Patent 8,423,960, 2013
392013
Using code motion and write and read delays to increase the probability of bug detection in concurrent systems
M Biberstein, E Farchi, S Ur
US Patent 7,712,081, 2010
392010
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