Follow
Chan Hyeong Park
Chan Hyeong Park
Professor of Electronics and Communications Engineering, Kwangwoon University, Republic of Korea
Verified email at kw.ac.kr
Title
Cited by
Cited by
Year
Accurate analysis of conduction and resistive-switching mechanisms in double-layered resistive-switching memory devices
JK Lee, S Jung, J Park, SW Chung, J Sung Roh, SJ Hong, I Hwan Cho, ...
Applied Physics Letters 101 (10), 2012
712012
The Noise and Random Telegraph Noise Characteristics in Floating-Gate nand Flash Memories
SH Bae, JH Lee, HI Kwon, JR Ahn, JC Om, CH Park, JH Lee
IEEE transactions on electron devices 56 (8), 1624-1630, 2009
332009
The first observation of shot noise characteristics in 10-nm scale MOSFETs
J Jeon, J Lee, J Kim, CH Park, H Lee, H Oh, HK Kang, BG Park, H Shin
2009 Symposium on VLSI Technology, 48-49, 2009
332009
Modeling of thermal noise in short-channel MOSFETs at saturation
CH Park, YJ Park
Solid-State Electronics 44 (11), 2053-2057, 2000
312000
Design of an X-band oscillator using novel miniaturized microstrip hairpin resonator
SW Seo, HY Jung, J Jeong, CH Park
2007 Asia-Pacific Microwave Conference, 1-4, 2007
272007
Formulas of 1/f noise in Schottky barrier diodes under reverse bias
CH Park, JH Lee
Solid-state electronics 69, 85-88, 2012
252012
Proximity-enhanced thermal radiation
CH Park, HA Haus, MS Weinberg
Journal of Physics D: Applied Physics 35 (21), 2857, 2002
212002
Statistical analysis of random telegraph noise in CMOS image sensors
JM Woo, HH Park, HS Min, YJ Park, SM Hong, CH Park
2008 International Conference on Simulation of Semiconductor Processes and …, 2008
182008
Characterization of traps and trap-related effects in recessed-gate normally-off AlGaN/GaN-based MOSHEMT
JH Bae, I Hwang, JM Shin, HI Kwon, CH Park, J Ha, JW Lee, H Choi, ...
2012 International Electron Devices Meeting, 13.2. 1-13.2. 4, 2012
172012
Influence of magnetic field on 1/f noise and thermal noise in multi-terminal homogeneous semiconductor resistors and discrimination between the number fluctuation model and the …
YS Kim, SS Yun, CH Park, HS Min, YJ Park
Solid-State Electronics 48 (5), 641-654, 2004
142004
Filtering technique to lower phase noise for 2.4 GHz CMOS VCO
W Yan, CH Park
2008 9th International Conference on Solid-State and Integrated-Circuit …, 2008
132008
Physics-based analysis and simulation of phase noise in oscillators
SM Hong, CH Park, HS Min, YJ Park
IEEE Transactions on Electron Devices 53 (9), 2195-2201, 2006
112006
NANOCAD framework for simulation of quantum effects in nanoscale MOSFET devices
SH Jin, CH Park, IY Chung, YJ Park, HS Min
JSTS: Journal of Semiconductor Technology and Science 6 (1), 1-9, 2006
112006
Analysis of DC/transient current and RTN behaviors related to traps in p-GaN gate HEMT
JH Bae, S Hwang, J Shin, HI Kwon, CH Park, H Choi, JB Park, J Kim, J Ha, ...
2013 IEEE International Electron Devices Meeting, 31.6. 1-31.6. 4, 2013
102013
Physics-Based Analysis and Simulation of Noise in MOSFETs Under Large-Signal Operation
SM Hong, CH Park, YJ Park, HS Min
IEEE transactions on electron devices 57 (5), 1110-1118, 2010
102010
Reconfigurable un‐equal division power divider with the compact size for high efficiency power amplifiers
J Jeong, C Hyeong Park
Microwave and Optical Technology Letters 50 (6), 1662-1665, 2008
92008
An X-band oscillator using a new hairpin resonator
SW Seo, JH Jeong, CH Park
The Journal of Korean Institute of Electromagnetic Engineering and Science …, 2008
8*2008
A low-power Ku-band downconverter in InGaP-GaAs HBT technology
J Lee, H Shin, CH Park, NY Kim
IEEE microwave and wireless components letters 15 (4), 193-195, 2005
72005
Flicker noise behavior in resistive memory devices with double-layered transition metal oxide
JK Lee, S Jung, BI Choe, J Park, SW Chung, JS Roh, SJ Hong, CH Park, ...
IEEE electron device letters 34 (2), 244-246, 2013
62013
Relationship Between Conduction Mechanism and Low-Frequency Noise in Polycrystalline--Based Resistive-Switching Memory Devices
JK Lee, IT Cho, HI Kwon, CS Hwang, CH Park, JH Lee
IEEE electron device letters 33 (7), 1063-1065, 2012
62012
The system can't perform the operation now. Try again later.
Articles 1–20