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Hao Jiang
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Layer-dependent dielectric and optical properties of centimeter-scale 2D WSe 2: evolution from a single layer to few layers
H Gu, B Song, M Fang, Y Hong, X Chen, H Jiang, W Ren, S Liu
Nanoscale 11 (47), 22762-22771, 2019
842019
Broadband optical properties of graphene and HOPG investigated by spectroscopic Mueller matrix ellipsometry
B Song, H Gu, S Zhu, H Jiang, X Chen, C Zhang, S Liu
Applied Surface Science 439, 1079-1087, 2018
802018
Layer‐Dependent Dielectric Function of Wafer‐Scale 2D MoS2
B Song, H Gu, M Fang, X Chen, H Jiang, R Wang, T Zhai, YT Ho, S Liu
Advanced Optical Materials 7 (2), 1801250, 2019
732019
Optimal broadband Mueller matrix ellipsometer using multi-waveplates with flexibly oriented axes
H Gu, X Chen, H Jiang, C Zhang, S Liu
Journal of Optics 18 (2), 025702, 2016
642016
Mueller matrix imaging ellipsometry for nanostructure metrology
S Liu, W Du, X Chen, H Jiang, C Zhang
Optics express 23 (13), 17316-17329, 2015
632015
Accurate characterization of nanoimprinted resist patterns using Mueller matrix ellipsometry
X Chen, S Liu, C Zhang, H Jiang, Z Ma, T Sun, Z Xu
Optics express 22 (12), 15165-15177, 2014
472014
Superhydrophilic Cu (OH) 2 nanowire-based QCM transducer with self-healing ability for humidity detection
J Lin, N Gao, J Liu, Z Hu, H Fang, X Tan, H Li, H Jiang, H Liu, T Shi, ...
Journal of Materials Chemistry A 7 (15), 9068-9077, 2019
432019
Complex Optical Conductivity of Two-Dimensional MoS2: A Striking Layer Dependency
B Song, H Gu, M Fang, YT Ho, X Chen, H Jiang, S Liu
The journal of physical chemistry letters 10 (20), 6246-6252, 2019
392019
Optical wafer defect inspection at the 10 nm technology node and beyond
J Zhu, J Liu, T Xu, S Yuan, Z Zhang, H Jiang, H Gu, R Zhou, S Liu
International Journal of Extreme Manufacturing 4 (3), 032001, 2022
382022
Measurement configuration optimization for accurate grating reconstruction by Mueller matrix polarimetry
X Chen, S Liu, C Zhang, H Jiang
Journal of Micro/Nanolithography, MEMS, and MOEMS 12 (3), 033013, 2013
372013
Real-time estimation of time-varying bending modes using fiber Bragg grating sensor arrays
H Jiang, B Van Der Veek, D Kirk, H Gutierrez
AIAA journal 51 (1), 178-185, 2013
372013
Depolarization artifacts in dual rotating-compensator Mueller matrix ellipsometry
W Li, C Zhang, H Jiang, X Chen, S Liu
Journal of Optics 18 (5), 055701, 2016
362016
Layer-dependent dielectric permittivity of topological insulator Bi2Se3 thin films
M Fang, Z Wang, H Gu, M Tong, B Song, X Xie, T Zhou, X Chen, H Jiang, ...
Applied Surface Science 509, 144822, 2020
352020
Improved measurement accuracy in optical scatterometry using correction-based library search
X Chen, S Liu, C Zhang, H Jiang
Applied optics 52 (27), 6726-6734, 2013
352013
Study of the retardance of a birefringent waveplate at tilt incidence by Mueller matrix ellipsometer
H Gu, X Chen, C Zhang, H Jiang, S Liu
Journal of Optics 20 (1), 015401, 2017
332017
Robust solution to the inverse problem in optical scatterometry
J Zhu, S Liu, X Chen, C Zhang, H Jiang
Optics express 22 (18), 22031-22042, 2014
312014
Comprehensive characterization of a general composite waveplate by spectroscopic Mueller matrix polarimetry
H Gu, X Chen, Y Shi, H Jiang, C Zhang, P Gong, S Liu
Optics express 26 (19), 25408-25425, 2018
292018
Complete Dielectric Tensor and Giant Optical Anisotropy in Quasi-One-Dimensional ZrTe5
Z Guo, H Gu, M Fang, B Song, W Wang, X Chen, C Zhang, H Jiang, ...
ACS Materials Letters 3 (5), 525-534, 2021
262021
Development of a spectroscopic Mueller matrix imaging ellipsometer for nanostructure metrology
X Chen, W Du, K Yuan, J Chen, H Jiang, C Zhang, S Liu
Review of Scientific Instruments 87 (5), 053707, 2016
262016
Mueller matrix ellipsometric detection of profile asymmetry in nanoimprinted grating structures
X Chen, C Zhang, S Liu, H Jiang, Z Ma, Z Xu
Journal of Applied Physics 116 (19), 194305, 2014
242014
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