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Co-authors
- Wei LiBeijing Institute of TechnologyVerified email at ieee.org
- Qian (Jenny) DuMississippi State UniversityVerified email at ece.msstate.edu
- Mengmeng Zhang(张蒙蒙)Beijing Institute of TechnologyVerified email at mail.buct.edu.cn
- Bing-Zhao Li (李炳照)Beijing Institute of Technology, Beijing, ChinaVerified email at bit.edu.cn
- Shengheng Liu (刘升恒)Southeast University, Associate ProfessorVerified email at seu.edu.cn
- Xin WuBeijing University of Posts and TelecommunicationsVerified email at bupt.edu.cn
- xudong zhaoBeijing Institute of TechnologyVerified email at bit.edu.cn
- Wei-Qiang Zhang (张卫强)Tsinghua University (清华大学)Verified email at tsinghua.edu.cn
- Xiang-Gen XiaDepartment of Electrical and Computer Engineering, University of Delaware, Newark, DE 19716, USAVerified email at ee.udel.edu
- Yongzhe LiAsst. Prof., Beijing Institute of TechnologyVerified email at bit.edu.cn
- Yimin D. ZhangTemple University, Electrical and Computer EngineeringVerified email at temple.edu
- Na LIUBeijing Institute of TechnologyVerified email at ieee.org
- Yuxiang Zhang (张宇翔)Beijing Institute of TechnologyVerified email at bit.edu.cn
- Moeness G. AminProfessor of ECE, Director of the Center for Advanced Communications, Villanova UniversityVerified email at villanova.edu