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Co-authors
Wei LiBeijing Institute of TechnologyVerified email at ieee.org
Qian (Jenny) DuMississippi State UniversityVerified email at ece.msstate.edu
Mengmeng Zhang(张蒙蒙)Beijing Institute of TechnologyVerified email at mail.buct.edu.cn
Bing-Zhao Li (李炳照)Beijing Institute of Technology, Beijing, ChinaVerified email at bit.edu.cn
Shengheng Liu (刘升恒)Southeast University, Associate ProfessorVerified email at seu.edu.cn
Xin WuBeijing University of Posts and TelecommunicationsVerified email at bupt.edu.cn
Wei-Qiang Zhang (张卫强)Tsinghua University (清华大学)Verified email at tsinghua.edu.cn
xudong zhaoBeijing Institute of TechnologyVerified email at bit.edu.cn
Yimin D. ZhangTemple University, Electrical and Computer EngineeringVerified email at temple.edu
Yongzhe LiAsst. Prof., Beijing Institute of TechnologyVerified email at bit.edu.cn
Na LIUBeijing Institute of TechnologyVerified email at ieee.org
Xiang-Gen XiaDepartment of Electrical and Computer Engineering, University of Delaware, Newark, DE 19716, USAVerified email at ee.udel.edu
Yuxiang Zhang (张宇翔)Beijing Institute of TechnologyVerified email at bit.edu.cn
Moeness G. AminProfessor of ECE, Director of the Center for Advanced Communications, Villanova UniversityVerified email at villanova.edu