Follow
Luis Entrena
Title
Cited by
Cited by
Year
Autonomous fault emulation: A new FPGA-based acceleration system for hardness evaluation
C Lopez-Ongil, M Garcia-Valderas, M Portela-Garcia, L Entrena
IEEE Transactions on Nuclear Science 54 (1), 252-261, 2007
1642007
Combinational and sequential logic optimization by redundancy addition and removal
LA Entrena, KT Cheng
IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 1995
1501995
Soft error sensitivity evaluation of microprocessors by multilevel emulation-based fault injection
L Entrena, M Garcia-Valderas, R Fernandez-Cardenal, A Lindoso, ...
IEEE Transactions on Computers 61 (3), 313-322, 2010
1392010
Multi-level logic optimization by redundancy addition and removal
KT Cheng, LA Entrena
1993 European Conference on Design Automation with the European Event in …, 1993
1261993
Sequential logic optimization by redundancy addition and removal
L Entrena, KT Cheng
Proceedings of 1993 International Conference on Computer Aided Design (ICCAD …, 1993
1161993
New techniques for speeding-up fault-injection campaigns
L Berrojo, I González, F Corno, MS Reorda, G Squillero, L Entrena, ...
Proceedings 2002 Design, Automation and Test in Europe Conference and …, 2002
1122002
Using benchmarks for radiation testing of microprocessors and FPGAs
H Quinn, WH Robinson, P Rech, M Aguirre, A Barnard, M Desogus, ...
IEEE Transactions on Nuclear Science 62 (6), 2547-2554, 2015
932015
AKARI-X: A pseudo random number generator for secure lightweight systems
H Martin, E San Millan, L Entrena, PPC Lopez
IOLTS, 13-15, 2011
55*2011
Analyzing the impact of single-event-induced charge sharing in complex circuits
S Pagliarini, F Kastensmidt, L Entrena, A Lindoso, E San Millan
IEEE Transactions on Nuclear Science 58 (6), 2768-2775, 2011
542011
A unified environment for fault injection at any design level based on emulation
C Lopez-Ongil, L Entrena, M Garcia-Valderas, M Portela, MA Aguirre, ...
IEEE Transactions on Nuclear Science 54 (4), 946-950, 2007
512007
Partial TMR in FPGAs using approximate logic circuits
AJ Sánchez-Clemente, L Entrena, M García-Valderas
IEEE Transactions on Nuclear Science 63 (4), 2233-2240, 2016
502016
Fault injection in modern microprocessors using on-chip debugging infrastructures
M Portela-Garcia, C Lopez-Ongil, MGG Valderas, L Entrena
IEEE Transactions on Dependable and Secure Computing 8 (2), 308-314, 2010
472010
An industrial environment for high-level fault-tolerant structures insertion and validation
L Berrojo, F Corno, L Entrena, I Gonzalez, C López, MS Reorda, ...
Proceedings 20th IEEE VLSI Test Symposium (VTS 2002), 229-236, 2002
472002
High performance FPGA-based image correlation
A Lindoso, L Entrena
Journal of Real-Time Image Processing 2, 223-233, 2007
462007
SET emulation considering electrical masking effects
L Entrena, MG Valderas, RF Cardenal, MP Garcia, CL Ongil
IEEE Transactions on Nuclear Science 56 (4), 2021-2025, 2009
442009
Error mitigation using approximate logic circuits: A comparison of probabilistic and evolutionary approaches
AJ Sanchez-Clemente, L Entrena, R Hrbacek, L Sekanina
IEEE Transactions on Reliability 65 (4), 1871-1883, 2016
392016
Logic masking for SET mitigation using approximate logic circuits
A Sanchez-Clemente, L Entrena, M García-Valderas, C López-Ongil
2012 IEEE 18th International On-Line Testing Symposium (IOLTS), 176-181, 2012
392012
Constrained placement methodology for reducing SER under single-event-induced charge sharing effects
L Entrena, A Lindoso, E San Millan, S Pagliarini, F Almeida, ...
IEEE Transactions on Nuclear Science 59 (4), 811-817, 2012
392012
Correlation-based fingerprint matching with orientation field alignment
A Lindoso, L Entrena, J Liu-Jimenez, E San Millan
Advances in Biometrics: International Conference, ICB 2007, Seoul, Korea …, 2007
392007
A rapid fault injection approach for measuring seu sensitivity in complex processors
M Portela-Garcia, C Lopez-Ongil, M Garcia-Valderas, L Entrena
13th IEEE International On-Line Testing Symposium (IOLTS 2007), 101-106, 2007
372007
The system can't perform the operation now. Try again later.
Articles 1–20