Bruno Ricc˛
Bruno Ricc˛
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Cited by
Cited by
Physics of resonant tunneling. The one-dimensional double-barrier case
B Ricco, MY Azbel
Physical Review B 29 (4), 1970, 1984
Transport properties of polycrystalline silicon films
G Baccarani, B Ricco, G Spadini
Journal of applied physics 49 (11), 5565-5570, 1978
High-field-induced degradation in ultra-thin SiO/sub 2/films
P Olivo, TN Nguyen, B Ricco
IEEE Transactions on Electron Devices 35 (12), 2259-2267, 1988
Resonant tunneling of holes in AlAs‐GaAs‐AlAs heterostructures
EE Mendez, WI Wang, B Ricco, L Esaki
Applied physics letters 47 (4), 415-417, 1985
Modeling and simulation of stress-induced leakage current in ultrathin SiO/sub 2/films
B Ricco, G Gozzi, M Lanzoni
IEEE Transactions on Electron Devices 45 (7), 1554-1560, 1998
CMOS DNA sensor array with integrated A/D conversion based on label-free capacitance measurement
C Stagni, C Guiducci, L Benini, B Ricc˛, S Carrara, B SamorÝ, C Paulus, ...
IEEE Journal of Solid-State Circuits 41 (12), 2956-2964, 2006
Nonvolatile multilevel memories for digital applications
B Ricco, G Torelli, M Lanzoni, A Manstretta, HE Maes, D Montanari, ...
Proceedings of the IEEE 86 (12), 2399-2423, 1998
Estimate of signal probability in combinational logic networks
S Ercolani, M Favalli, M Damiani, P Olivo, B Ricco
Proceedings of the 1st European test conference, 132,133,134,135,136,137,138á…, 1989
Electrical impedance spectroscopy (EIS) for biological analysis and food characterization: A review
M Grossi, B Ricc˛
Journal of sensors and sensor systems 6 (2), 303-325, 2017
Scaling the MOS transistor below 0.1/spl mu/m: methodology, device structures, and technology requirements
C Fiegna, H Iwai, T Wada, M Saito, E Sangiorgi, B Ricco
IEEE Transactions on Electron Devices 41 (6), 941-951, 1994
Novel Mechanism for Tunneling and Breakdown of Thin Si O 2 Films
B Ricco, MY Azbel, MH Brodsky
Physical review letters 51 (19), 1795, 1983
Low power control techniques for TFT LCD displays
F Gatti, A Acquaviva, L Benini, B Ricco'
Proceedings of the 2002 international conference on Compilers, architectureá…, 2002
A comprehensive analytical and numerical model of polysilicon emitter contacts in bipolar transistors
Z Yu, B Ricco, RW Dutton
IEEE Transactions on Electron Devices 31 (6), 773-784, 1984
A general purpose device simulator coupling Poisson and Monte Carlo transport with applications to deep submicron MOSFETs
F Venturi, RK Smith, EC Sangiorgi, MR Pinto, B Ricco
IEEE Transactions on Computer-Aided Design of Integrated Circuits andá…, 1989
DNA detection by integrable electronics
C Guiducci, C Stagni, G Zuccheri, A Bogliolo, L Benini, B Samorı, B Ricc˛
Biosensors and Bioelectronics 19 (8), 781-787, 2004
Quantum-mechanical modeling of accumulation layers in MOS structure
J Sune, P Olivo, B Ricco
IEEE Transactions on Electron Devices 39 (7), 1732-1739, 1992
Monitoring system activity for OS-directed dynamic power management
L Benini, A Bogliolo, S Cavallucci, B Riccˇ
Proceedings. 1998 International Symposium on Low Power Electronics andá…, 1998
A many-band silicon model for hot-electron transport at high energies
R Brunetti, C Jacoboni, F Venturi, E Sangiorgi, B Ricco
Solid-state electronics 32 (12), 1663-1667, 1989
Self‐consistent solution of the Poisson and Schr÷dinger equations in accumulated semiconductor‐insulator interfaces
J Sune, P Olivo, B Ricco
Journal of applied physics 70 (1), 337-345, 1991
Trading-off programming speed and current absorption in flash memories with the ramped-gate programming technique
D Esseni, C Villa, S Tassan, B Ricco
Ieee Transactions on Electron Devices 47 (4), 828-834, 2000
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