Stelios Neophytou

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Maria K MichaelElectrical and Computer Engineering Department, KIOS Center of Excellence, University of CyprusVerified email at ucy.ac.cy
Yoram ShiftanTechnionVerified email at technion.ac.il
Jaka SodnikProfessor of Electrical Engineering, University of LjubljanaVerified email at fe.uni-lj.si
Amalia PolydoropoulouProfessor, Department of Shipping, Trade and Transport, University of the AegeanVerified email at aegean.gr
Domokos Esztergár-KissBME Department of Transportation Technology (Közlekedésüzemi Tanszék)Verified email at mail.bme.hu
Arnór B. ElvarssonResearcher, ETH ZürichVerified email at ibi.baug.ethz.ch
Jamil HamadnehAssistant Professor at Palestine Technical University -KadoorieVerified email at ptuk.edu.ps
Ioannis TsourosUniversity of the AegeanVerified email at aegean.gr
Shelly EzioniPhD Candidate, TechnionVerified email at tx.technion.ac.il
Spyros TragoudasProfessor, Southern Illinois University CarbondaleVerified email at siu.edu
Ioannis KyriakidesUniversity of NicosiaVerified email at unic.ac.cy
Graham ParkhurstProfessor of Sustainable Mobility, Centre for Transport and Society, University of the West of England, Bristol, UKVerified email at uwe.ac.uk
Floridea Di CiommocambiaMO|changing MObilityVerified email at cambiamo.net
Nima DadashzadehLecturer (Assistant Professor) in Huddersfield Business SchoolVerified email at hud.ac.uk
Constantinos EfstathiouProfessor, Dept. of Informatics and Computer Engineering, University of West AtticaVerified email at uniwa.gr
Cleo SgouropoulouUniversity of West AtticaVerified email at uniwa.gr
Ioannis VoyiatzisUniversity of West AtticaVerified email at uniwa.gr
Dimitris GizopoulosNational and Kapodistrian University of AthensVerified email at di.uoa.gr
Marco OttaviUniversity of Rome Tor VergataVerified email at ing.uniroma2.it
Salvatore PontarelliComputer Science - SapienzaVerified email at uniroma1.it

Stelios Neophytou

Associate Professor at Computer Engineering, University of Nicosia

Verified email at unic.ac.cy - Homepage

VLSI Testing Binary Decision Diagrams Algorithms for Testing of Digital Integrated Circuits


Title Sort by citations Sort by year Sort by title	Cited by Cited by	Year
Modeling cross-national differences in automated vehicle acceptance S Etzioni, J Hamadneh, AB Elvarsson, D Esztergár-Kiss, M Djukanovic, ... Sustainability 12 (22), 9765, 2020	49	2020
Who is willing to share their AV? Insights about gender differences among seven countries A Polydoropoulou, I Tsouros, N Thomopoulos, C Pronello, A Elvarsson, ... Sustainability 13 (9), 4769, 2021	44	2021
Test set generation with a large number of unspecified bits using static and dynamic techniques SN Neophytou, MK Michael IEEE Transactions on Computers 59 (3), 301-316, 2009	38	2009
Scalable parallel fault simulation for shared-memory multiprocessor systems S Hadjitheophanous, SN Neophytou, MK Michael VLSI Test Symposium (VTS), 2016 IEEE 34th, 1-6, 2016	18	2016
On the relaxation of n-detect test sets S Neophytou, MK Michael 26th IEEE VLSI Test Symposium (vts 2008), 187-192, 2008	16	2008
Identification of critical primitive path delay faults without any path enumeration K Christou, MK Michael, S Neophytou 2010 28th VLSI Test Symposium (VTS), 9-14, 2010	15	2010
Efficient deterministic test generation for BIST schemes with LFSR reseeding S Neophytou, MK Michael, S Tragoudas 12th IEEE International On-Line Testing Symposium (IOLTS'06), 6 pp., 2006	14	2006
Dependability threats C Bolchini, MK Michael, A Miele, S Neophytou Dependable Multicore Architectures at Nanoscale, 37-92, 2018	13*	2018
Generating diverse test sets for multiple fault detections based on fault cone partitioning S Neophytou, MK Michael, K Christou 2009 24th IEEE International Symposium on Defect and Fault Tolerance in VLSI …, 2009	10	2009
Functions for quality transition-fault tests and their applications in test-set enhancement SN Neophytou, MK Michael, S Tragoudas IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2006	10	2006
Test Pattern Generation of Relaxed-Detect Test Sets SN Neophytou, MK Michael IEEE transactions on very large scale integration (VLSI) systems 20 (3), 410-423, 2011	9	2011
Hierarchical fault compatibility identification for test generation with a small number of specified bits S Neophytou, MK Michael 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI …, 2007	9	2007
Utilizing shared memory multi-cores to speed-up the ATPG process S Hadjitheophanous, SN Neophytou, MK Michael 2016 21th IEEE European Test Symposium (ETS), 1-6, 2016	7	2016
Modeling the operating characteristics of iot for underwater sound classification CC Constantinou, E Michaelides, I Alexopoulos, T Pieri, S Neophytou, ... 2021 IEEE 11th Annual Computing and Communication Workshop and Conference …, 2021	4	2021
On the impact of fault list partitioning in parallel implementations for dynamic test compaction considering multicore systems S Neophytou, S Hadjitheophanous, MK Michael Design and Test Symposium (IDT), 2013 8th International, 1-6, 2013	4	2013
Test set embedding into accumulator-generated sequences targeting hard-to-detect faults I Voyiatzis, S Neophytou, M Michaeel, S Hadjitheophanous, ... Design and Test Symposium (IDT), 2013 8th International, 1-2, 2013	4*	2013
Two new methods for accurate test set relaxation via test set replacement S Neophytou, MK Michael 9th International Symposium on Quality Electronic Design (isqed 2008), 827-831, 2008	4	2008
Test set enhancement for quality transition faults using function-based methods S Neophytou, MK Michael, S Tragoudas Proceedings of the 15th ACM Great Lakes symposium on VLSI, 182-187, 2005	4	2005
Optimal variable ordering in zbdd-based path representations for directed acyclic graphs SN Neophytou, MK Michael 2014 IEEE 32nd International Conference on Computer Design (ICCD), 489-492, 2014	3	2014
Functions for quality transition fault tests MK Michael, S Neophytou, S Tragoudas Sixth international symposium on quality electronic design (isqed'05), 327-332, 2005	3	2005

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