Stelios Neophytou

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Maria K MichaelElectrical and Computer Engineering Department, KIOS Center of Excellence, University of CyprusVerified email at ucy.ac.cy
Yoram ShiftanTechnionVerified email at technion.ac.il
Jaka SodnikProfessor of Electrical Engineering, University of LjubljanaVerified email at fe.uni-lj.si
Amalia PolydoropoulouProfessor, Department of Shipping, Trade and Transport, University of the AegeanVerified email at aegean.gr
Domokos Esztergár-KissBME Department of Transportation Technology (Közlekedésüzemi Tanszék)Verified email at mail.bme.hu
Arnór B. ElvarssonResearcher, ETH ZürichVerified email at ibi.baug.ethz.ch
Jamil HamadnehPhD, Department of Buildings, Roads and Space Engineering, Palestine Technical University-KadoorieVerified email at ptuk.edu.ps
Ioannis TsourosUniversity of the AegeanVerified email at aegean.gr
Ioannis KyriakidesUniversity of NicosiaVerified email at unic.ac.cy
Milena DjukanovicFaculty of Electrical Engineering, University of MontenegroVerified email at ucg.ac.me
Graham ParkhurstProfessor of Sustainable Mobility, Centre for Transport and Society, University of the West of England, Bristol, UKVerified email at uwe.ac.uk
Floridea Di CiommocambiaMO|changing MObilityVerified email at cambiamo.net
Nima DadashzadehPostdoctoral Research FellowVerified email at port.ac.uk
Constantinos EfstathiouProfessor, Dept. of Informatics and Computer Engineering, University of West AtticaVerified email at uniwa.gr
Cleo SgouropoulouUniversity of West AtticaVerified email at uniwa.gr
Christos C. ConstantinouRoyal Institute of Technology (KTH)Verified email at kth.se
Cristiana BolchiniPolitecnico di MilanoVerified email at polimi.it
Antonio MielePolitecnico di MilanoVerified email at polimi.it
Konstantinos MichailPost-DocVerified email at ieee.org

Stelios Neophytou

Associate Professor at Computer Engineering, University of Nicosia

Verified email at unic.ac.cy - Homepage

VLSI Testing Binary Decision Diagrams Algorithms for Testing of Digital Integrated Circuits


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Test set generation with a large number of unspecified bits using static and dynamic techniques SN Neophytou, MK Michael IEEE Transactions on Computers 59 (3), 301-316, 2009	35	2009
Modeling cross-national differences in automated vehicle acceptance S Etzioni, J Hamadneh, AB Elvarsson, D Esztergár-Kiss, M Djukanovic, ... Sustainability 12 (22), 9765, 2020	33	2020
Who is willing to share their AV? Insights about gender differences among seven countries A Polydoropoulou, I Tsouros, N Thomopoulos, C Pronello, A Elvarsson, ... Sustainability 13 (9), 4769, 2021	25	2021
Scalable parallel fault simulation for shared-memory multiprocessor systems S Hadjitheophanous, SN Neophytou, MK Michael VLSI Test Symposium (VTS), 2016 IEEE 34th, 1-6, 2016	16	2016
On the Relaxation of n-detect Test Sets S Neophytou, MK Michael 26th IEEE VLSI Test Symposium (vts 2008), 187-192, 2008	15	2008
Identification of critical primitive path delay faults without any path enumeration K Christou, MK Michael, S Neophytou 2010 28th VLSI Test Symposium (VTS), 9-14, 2010	14	2010
Efficient deterministic test generation for BIST schemes with LFSR reseeding S Neophytou, MK Michael, S Tragoudas 12th IEEE International On-Line Testing Symposium (IOLTS'06), 6 pp., 2006	13	2006
Dependability threats C Bolchini, MK Michael, A Miele, S Neophytou Dependable Multicore Architectures at Nanoscale, 37-92, 2018	11*	2018
Functions for quality transition-fault tests and their applications in test-set enhancement SN Neophytou, MK Michael, S Tragoudas IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2006	11	2006
Hierarchical fault compatibility identification for test generation with a small number of specified bits S Neophytou, MK Michael 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI …, 2007	9	2007
Generating diverse test sets for multiple fault detections based on fault cone partitioning S Neophytou, MK Michael, K Christou 2009 24th IEEE International Symposium on Defect and Fault Tolerance in VLSI …, 2009	8	2009
Test Pattern Generation of Relaxed-Detect Test Sets SN Neophytou, MK Michael IEEE transactions on very large scale integration (VLSI) systems 20 (3), 410-423, 2011	7	2011
Utilizing shared memory multi-cores to speed-up the ATPG process S Hadjitheophanous, SN Neophytou, MK Michael 2016 21th IEEE European Test Symposium (ETS), 1-6, 2016	6	2016
On the impact of fault list partitioning in parallel implementations for dynamic test compaction considering multicore systems S Neophytou, S Hadjitheophanous, MK Michael Design and Test Symposium (IDT), 2013 8th International, 1-6, 2013	4	2013
Two new methods for accurate test set relaxation via test set replacement S Neophytou, MK Michael 9th International Symposium on Quality Electronic Design (isqed 2008), 827-831, 2008	4	2008
Test set enhancement for quality transition faults using function-based methods S Neophytou, MK Michael, S Tragoudas Proceedings of the 15th ACM Great Lakes symposium on VLSI, 182-187, 2005	4	2005
Modeling the operating characteristics of iot for underwater sound classification CC Constantinou, E Michaelides, I Alexopoulos, T Pieri, S Neophytou, ... 2021 IEEE 11th Annual Computing and Communication Workshop and Conference …, 2021	3	2021
Optimal variable ordering in zbdd-based path representations for directed acyclic graphs SN Neophytou, MK Michael 2014 IEEE 32nd International Conference on Computer Design (ICCD), 489-492, 2014	3	2014
Test set embedding into accumulator-generated sequences targeting hard-to-detect faults I Voyiatzis, S Neophytou, M Michaeel, S Hadjitheophanous, ... Design and Test Symposium (IDT), 2013 8th International, 1-2, 2013	3*	2013
Functions for quality transition fault tests MK Michael, S Neophytou, S Tragoudas Sixth international symposium on quality electronic design (isqed'05), 327-332, 2005	3	2005

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