Stelios Neophytou
Stelios Neophytou
Associate Professor at Computer Engineering, University of Nicosia
Verified email at - Homepage
Cited by
Cited by
Test set generation with a large number of unspecified bits using static and dynamic techniques
SN Neophytou, MK Michael
IEEE Transactions on Computers 59 (3), 301-316, 2009
Modeling cross-national differences in automated vehicle acceptance
S Etzioni, J Hamadneh, AB Elvarsson, D Esztergár-Kiss, M Djukanovic, ...
Sustainability 12 (22), 9765, 2020
Who is willing to share their AV? Insights about gender differences among seven countries
A Polydoropoulou, I Tsouros, N Thomopoulos, C Pronello, A Elvarsson, ...
Sustainability 13 (9), 4769, 2021
Scalable parallel fault simulation for shared-memory multiprocessor systems
S Hadjitheophanous, SN Neophytou, MK Michael
VLSI Test Symposium (VTS), 2016 IEEE 34th, 1-6, 2016
On the Relaxation of n-detect Test Sets
S Neophytou, MK Michael
26th IEEE VLSI Test Symposium (vts 2008), 187-192, 2008
Identification of critical primitive path delay faults without any path enumeration
K Christou, MK Michael, S Neophytou
2010 28th VLSI Test Symposium (VTS), 9-14, 2010
Efficient deterministic test generation for BIST schemes with LFSR reseeding
S Neophytou, MK Michael, S Tragoudas
12th IEEE International On-Line Testing Symposium (IOLTS'06), 6 pp., 2006
Dependability threats
C Bolchini, MK Michael, A Miele, S Neophytou
Dependable Multicore Architectures at Nanoscale, 37-92, 2018
Functions for quality transition-fault tests and their applications in test-set enhancement
SN Neophytou, MK Michael, S Tragoudas
IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2006
Hierarchical fault compatibility identification for test generation with a small number of specified bits
S Neophytou, MK Michael
22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI …, 2007
Generating diverse test sets for multiple fault detections based on fault cone partitioning
S Neophytou, MK Michael, K Christou
2009 24th IEEE International Symposium on Defect and Fault Tolerance in VLSI …, 2009
Test Pattern Generation of Relaxed-Detect Test Sets
SN Neophytou, MK Michael
IEEE transactions on very large scale integration (VLSI) systems 20 (3), 410-423, 2011
Utilizing shared memory multi-cores to speed-up the ATPG process
S Hadjitheophanous, SN Neophytou, MK Michael
2016 21th IEEE European Test Symposium (ETS), 1-6, 2016
On the impact of fault list partitioning in parallel implementations for dynamic test compaction considering multicore systems
S Neophytou, S Hadjitheophanous, MK Michael
Design and Test Symposium (IDT), 2013 8th International, 1-6, 2013
Two new methods for accurate test set relaxation via test set replacement
S Neophytou, MK Michael
9th International Symposium on Quality Electronic Design (isqed 2008), 827-831, 2008
Test set enhancement for quality transition faults using function-based methods
S Neophytou, MK Michael, S Tragoudas
Proceedings of the 15th ACM Great Lakes symposium on VLSI, 182-187, 2005
Modeling the operating characteristics of iot for underwater sound classification
CC Constantinou, E Michaelides, I Alexopoulos, T Pieri, S Neophytou, ...
2021 IEEE 11th Annual Computing and Communication Workshop and Conference …, 2021
Optimal variable ordering in zbdd-based path representations for directed acyclic graphs
SN Neophytou, MK Michael
2014 IEEE 32nd International Conference on Computer Design (ICCD), 489-492, 2014
Test set embedding into accumulator-generated sequences targeting hard-to-detect faults
I Voyiatzis, S Neophytou, M Michaeel, S Hadjitheophanous, ...
Design and Test Symposium (IDT), 2013 8th International, 1-2, 2013
Functions for quality transition fault tests
MK Michael, S Neophytou, S Tragoudas
Sixth international symposium on quality electronic design (isqed'05), 327-332, 2005
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