| Ask the mutants: Mutating faulty programs for fault localization S Moon, Y Kim, M Kim, S Yoo 2014 IEEE Seventh International Conference on Software Testing, Verification …, 2014 | 334 | 2014 |
| Directed test suite augmentation: techniques and tradeoffs Z Xu, Y Kim, M Kim, G Rothermel, MB Cohen Proceedings of the eighteenth ACM SIGSOFT international symposium on …, 2010 | 134 | 2010 |
| Mutation-based fault localization for real-world multilingual programs (T) S Hong, B Lee, T Kwak, Y Jeon, B Ko, Y Kim, M Kim 2015 30th IEEE/ACM International Conference on Automated Software …, 2015 | 84 | 2015 |
| Automated unit testing of large industrial embedded software using concolic testing Y Kim, Y Kim, T Kim, G Lee, Y Jang, M Kim 2013 28th IEEE/ACM International Conference on Automated Software …, 2013 | 64 | 2013 |
| Precise learn-to-rank fault localization using dynamic and static features of target programs Y Kim, S Mun, S Yoo, M Kim ACM Transactions on Software Engineering and Methodology (TOSEM) 28 (4), 1-34, 2019 | 58 | 2019 |
| Industrial application of concolic testing approach: A case study on libexif by using CREST-BV and KLEE Y Kim, M Kim, YJ Kim, Y Jang 2012 34th International Conference on Software Engineering (ICSE), 1143-1152, 2012 | 56 | 2012 |
| A scalable distributed concolic testing approach: An empirical evaluation M Kim, Y Kim, G Rothermel 2012 IEEE Fifth International Conference on Software Testing, Verification …, 2012 | 56 | 2012 |
| A hybrid directed test suite augmentation technique Z Xu, Y Kim, M Kim, G Rothermel 2011 IEEE 22nd international symposium on software reliability engineering …, 2011 | 47 | 2011 |
| A comparative study of software model checkers as unit testing tools: An industrial case study M Kim, Y Kim, H Kim IEEE transactions on software engineering 37 (2), 146-160, 2010 | 47 | 2010 |
| Industrial application of concolic testing on embedded software: Case studies M Kim, Y Kim, Y Jang 2012 IEEE Fifth International Conference on Software Testing, Verification …, 2012 | 43 | 2012 |
| MUSEUM: Debugging real-world multilingual programs using mutation analysis S Hong, T Kwak, B Lee, Y Jeon, B Ko, Y Kim, M Kim Information and Software Technology 82, 80-95, 2017 | 39 | 2017 |
| Concolic testing of the multi-sector read operation for flash storage platform software M Kim, Y Kim, Y Choi Formal Aspects of Computing 24, 355-374, 2012 | 35 | 2012 |
| Precise concolic unit testing of c programs using extended units and symbolic alarm filtering Y Kim, Y Choi, M Kim Proceedings of the 40th International Conference on Software Engineering …, 2018 | 33 | 2018 |
| SCORE: a scalable concolic testing tool for reliable embedded software Y Kim, M Kim Proceedings of the 19th ACM SIGSOFT symposium and the 13th European …, 2011 | 32 | 2011 |
| Music: Mutation analysis tool with high configurability and extensibility DL Phan, Y Kim, M Kim 2018 IEEE international conference on software testing, verification and …, 2018 | 30 | 2018 |
| Formal verification of a flash memory device driver–an experience report M Kim, Y Choi, Y Kim, H Kim Model Checking Software: 15th International SPIN Workshop, Los Angeles, CA …, 2008 | 30 | 2008 |
| Directed test suite augmentation: an empirical investigation Z Xu, Y Kim, M Kim, MB Cohen, G Rothermel Software Testing, Verification and Reliability 25 (2), 77-114, 2015 | 28 | 2015 |
| Hybrid directed test suite augmentation: An interleaving framework Y Kim, Z Zu, M Kim, MB Cohen, G Rothermel 2014 IEEE Seventh International Conference on Software Testing, Verification …, 2014 | 27 | 2014 |
| Concolic testing for high test coverage and reduced human effort in automotive industry Y Kim, D Lee, J Baek, M Kim 2019 IEEE/ACM 41st International Conference on Software Engineering …, 2019 | 26 | 2019 |
| Concolic testing of the multi-sector read operation for flash memory file system M Kim, Y Kim Brazilian Symposium on Formal Methods, 251-265, 2009 | 25 | 2009 |
Moonzoo KimAssociate Professor at School of Computing, KAISTVerified email at kaist.ac.kr
