Eduardo Alves

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Nuno P. BarradasC2TN, DECN, Instituto Superior Técnico, Universidade de LisboaVerified email at ctn.tecnico.ulisboa.pt
Teresa MonteiroDepartamento de Física e i3N, Universidade de AveiroVerified email at ua.pt
Filipe VazUniversidade do Minho, PortugalVerified email at fisica.uminho.pt
K. P. O'Donnellex-Strathclyde UniversityVerified email at strath.ac.uk
Norberto CatarinoInstituto de Plasmas e Fusão Nuclear, IST, Universidade de LisboaVerified email at ctn.ist.utl.pt
M.J.Soares; J. SoaresDepartamento Física, Universidade de AveiroVerified email at ua.pt
Sergio Manuel de Sousa PereiraCICECO and Physics Department University of AveiroVerified email at ua.pt
S. MagalhãesInstituto Superior TécnicoVerified email at ctn.tecnico.ulisboa.pt
Robert MartinProfessor of Physics, Strathclyde UniversityVerified email at strath.ac.uk
Luis CunhaPhysics Department - University of Minho (Portugal)Verified email at fisica.uminho.pt
J.G. CorreiaSenior Researcher, IST-C2TN, Universidade de Lisboa, PortugalVerified email at tecnico.ulisboa.pt
Carlos MarquesSevenAir AcademyVerified email at itn.pt
Jari LikonenVTTVerified email at vtt.fi
Albano CavaleiroProfessor de Engenharia Mecânica, University of CoimbraVerified email at dem.uc.pt
Philippe GoudeauCNRSVerified email at univ-poitiers.fr
EMILIO NOGALES DIAZUniversidad Complutense de MadridVerified email at fis.ucm.es
Kalle HeinolaInternational Atomic Energy AgencyVerified email at iaea.org
Aleksandra Baron-WiechecGuangdon Technion - Israel Institute of TechnologyVerified email at gtiit.edu.cn
Carlos José Macedo TavaresAssociate Professor with Habilitation in Physics, Center of Physics, University of Minho, PortugalVerified email at fisica.uminho.pt
Joel BorgesAssistant Researcher, Centre of Physics, University of MinhoVerified email at sapo.pt

Eduardo Alves

Full Researcher, DECN, Instituto Superior Técnico, Universidade de Lisboa

Verified email at tecnico.ulisboa.pt

Charged particle interactions with solids ion beam analysis and materials processing


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Effect of post-annealing on the properties of copper oxide thin films obtained from the oxidation of evaporated metallic copper V Figueiredo, E Elangovan, G Goncalves, P Barquinha, L Pereira, ... Applied Surface Science 254 (13), 3949-3954, 2008	319	2008
Strain and composition distributions in wurtzite InGaN/GaN layers extracted from x-ray reciprocal space mapping S Pereira, MR Correia, E Pereira, KP O’Donnell, E Alves, AD Sequeira, ... Applied physics letters 80 (21), 3913-3915, 2002	282	2002
Compositional pulling effects in In x Ga 1− x N/G a N layers: A combined depth-resolved cathodoluminescence and Rutherford backscattering/channeling study S Pereira, MR Correia, E Pereira, KP O’donnell, C Trager-Cowan, ... Physical Review B 64 (20), 205311, 2001	276	2001
Characterisation of Ti1− xSixNy nanocomposite films F Vaz, L Rebouta, P Goudeau, J Pacaud, H Garem, JP Riviere, ... Surface and Coatings Technology 133, 307-313, 2000	237	2000
Structural, optical and mechanical properties of coloured TiNxOy thin films F Vaz, P Cerqueira, L Rebouta, SMC Nascimento, E Alves, P Goudeau, ... Thin Solid Films 447, 449-454, 2004	234	2004
Influence of nitrogen content on the structural, mechanical and electrical properties of TiN thin films F Vaz, J Ferreira, E Ribeiro, L Rebouta, S Lanceros-Méndez, JA Mendes, ... Surface and Coatings Technology 191 (2-3), 317-323, 2005	212	2005
Overview of the JET results in support to ITER X Litaudon, S Abduallev, M Abhangi, P Abreu, M Afzal, KM Aggarwal, ... Nuclear Fusion 57 (10), 102001, 2017	197	2017
Anomalous Ion Channeling in Bilayers: Determination of the Strain State K Lorenz, N Franco, E Alves, IM Watson, RW Martin, KP O’donnell Physical review letters 97 (8), 085501, 2006	185	2006
Microstructure and mechanical properties of nanocomposite (Ti, Si, Al) N coatings S Carvalho, L Rebouta, A Cavaleiro, LA Rocha, J Gomes, E Alves Thin Solid Films 398, 391-396, 2001	165	2001
Metal-organic vapor phase epitaxy and properties of AlInN in the whole compositional range C Hums, J Bläsing, A Dadgar, A Diez, T Hempel, J Christen, A Krost, ... Applied Physics Letters 90 (2), 2007	153	2007
Compositional dependence of the strain-free optical band gap in InxGa1− xN layers S Pereira, MR Correia, T Monteiro, E Pereira, E Alves, AD Sequeira, ... Applied physics letters 78 (15), 2137-2139, 2001	149	2001
Hard nanocomposite Ti–Si–N coatings prepared by DC reactive magnetron sputtering L Rebouta, CJ Tavares, R Aimo, Z Wang, K Pischow, E Alves, TC Rojas, ... Surface and Coatings Technology 133, 234-239, 2000	149	2000
Materials design data for reduced activation martensitic steel type EUROFER AAF Tavassoli, A Alamo, L Bedel, L Forest, JM Gentzbittel, JW Rensman, ... Journal of Nuclear Materials 329, 257-262, 2004	140	2004
Overview of the JET preparation for deuterium–tritium operation with the ITER like-wall E Joffrin, S Abduallev, M Abhangi, P Abreu, V Afanasev, M Afzal, ... Nuclear Fusion 59 (11), 112021, 2019	138	2019
Damage formation and annealing at low temperatures in ion implanted ZnO K Lorenz, E Alves, E Wendler, O Bilani, W Wesch, M Hayes Applied physics letters 87 (19), 2005	134	2005
Plasma–wall interaction studies within the EUROfusion consortium: progress on plasma-facing components development and qualification S Brezinsek, JW Coenen, T Schwarz-Selinger, K Schmid, A Kirschner, ... Nuclear fusion 57 (11), 116041, 2017	132	2017
Photoluminescence studies in ZnO samples C Boemare, T Monteiro, MJ Soares, JG Guilherme, E Alves Physica B: Condensed Matter 308, 985-988, 2001	128	2001
Direct evidence for As as a Zn-site impurity in ZnO U Wahl, E Rita, JG Correia, AC Marques, E Alves, JC Soares, ... Physical review letters 95 (21), 215503, 2005	126	2005
Structural and optical properties of InGaN/GaN layers close to the critical layer thickness S Pereira, MR Correia, E Pereira, C Trager-Cowan, F Sweeney, ... Applied physics letters 81 (7), 1207-1209, 2002	125	2002
Identification of the prime optical center in IS Roqan, KP O'Donnell, RW Martin, PR Edwards, SF Song, A Vantomme, ... Physical Review B—Condensed Matter and Materials Physics 81 (8), 085209, 2010	123	2010

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