A review on the reliability of GaN-based LEDs M Meneghini, LR Trevisanello, G Meneghesso, E Zanoni IEEE Transactions on Device and Materials Reliability 8 (2), 323-331, 2008 | 326 | 2008 |
Accelerated life test of high brightness light emitting diodes L Trevisanello, M Meneghini, G Mura, M Vanzi, M Pavesi, G Meneghesso, ... IEEE Transactions on Device and Materials Reliability 8 (2), 304-311, 2008 | 211 | 2008 |
High temperature electro-optical degradation of InGaN/GaN HBLEDs M Meneghini, L Trevisanello, C Sanna, G Mura, M Vanzi, G Meneghesso, ... Microelectronics Reliability 47 (9-11), 1625-1629, 2007 | 110 | 2007 |
High-temperature degradation of GaN LEDs related to passivation M Meneghini, LR Trevisanello, U Zehnder, T Zahner, U Strauss, ... IEEE transactions on electron devices 53 (12), 2981-2987, 2006 | 97 | 2006 |
High brightness GaN LEDs degradation during dc and pulsed stress M Meneghini, S Podda, A Morelli, R Pintus, L Trevisanello, ... Microelectronics Reliability 46 (9-11), 1720-1724, 2006 | 71 | 2006 |
Reversible degradation of ohmic contacts on p-GaN for application in high-brightness LEDs M Meneghini, LR Trevisanello, U Zehnder, G Meneghesso, E Zanoni IEEE transactions on electron devices 54 (12), 3245-3251, 2007 | 61 | 2007 |
Thermal stability analysis of high brightness LED during high temperature and electrical aging LR Trevisanello, M Meneghini, G Mura, C Sanna, S Buso, G Spiazzi, ... Seventh International Conference on Solid State Lighting 6669, 231-240, 2007 | 61 | 2007 |
A model for the thermal degradation of metal/(p-GaN) interface in GaN-based light emitting diodes M Meneghini, L Rigutti, LR Trevisanello, A Cavallini, G Meneghesso, ... Journal of Applied Physics 103 (6), 2008 | 50 | 2008 |
Extensive analysis of the degradation of phosphor-converted LEDs M Meneghini, LR Trevisanello, F De Zuani, N Trivellin, G Meneghesso, ... Ninth International Conference on Solid State Lighting 7422, 82-93, 2009 | 35 | 2009 |
Stability and performance evaluation of high-brightness light-emitting diodes under DC and pulsed bias conditions M Meneghini, L Trevisanello, S Podda, S Buso, G Spiazzi, G Meneghesso, ... Sixth International Conference on Solid State Lighting 6337, 134-141, 2006 | 30 | 2006 |
High-temperature failure of GaN LEDs related with passivation M Meneghini, L Trevisanello, G Meneghesso, E Zanoni, F Rossi, ... Superlattices and Microstructures 40 (4-6), 405-411, 2006 | 25 | 2006 |
Thermally activated degradation and package instabilities of low flux LEDs L Trevisanello, F De Zuani, M Meneghini, N Trivellin, E Zanoni, ... 2009 IEEE international reliability physics symposium, 98-103, 2009 | 24 | 2009 |
Combined optical and electrical analysis of AlGaN-based deep-UV LEDs reliability M Meneghini, N Trivellin, L Trevisanello, A Lunev, J Yang, Y Bilenko, ... 2008 IEEE International Reliability Physics Symposium, 441-445, 2008 | 17 | 2008 |
Failure mechanisms of gallium nitride LEDs related with passivation M Meneghini, LR Trevisanello, S Levada, G Meneghesso, G Tamiazzo, ... IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest., 4 …, 2005 | 15 | 2005 |
Lighting module for mounting onto a rail having an electrical contact M Hast, LR Trevisanello, F Zanon US Patent 8,926,134, 2015 | 13 | 2015 |
Reversible degradation of GaN LEDs related to passivation M Meneghini, LR Trevisanello, R Penzo, M Benedetti, U Zehnder, ... 2007 IEEE International Reliability Physics Symposium Proceedings. 45th …, 2007 | 12 | 2007 |
Thermal degradation of InGaN/GaN LEDs ohmic contacts M Meneghini, L Trevisanello, U Zehnder, G Meneghesso, E Zanoni physica status solidi c 5 (6), 2250-2253, 2008 | 10 | 2008 |
Analysis of diffusion involved in degradation of InGaN-based laser diodes K Orita, S Takigawa, M Yuri, T Tanaka, M Meneghini, N Trivellin, ... 2009 IEEE International Reliability Physics Symposium, 736-740, 2009 | 6 | 2009 |
Analysis of the temperature impact on reliability of GaN-based light emitting diodes LR Trevisanello Università degli studi di Padova, 2008 | 6 | 2008 |
Method of producing flexible electrical cords and connector therefor A Zanotto, S Bobbo, LR Trevisanello, F Zanon, M Caldon US Patent 9,407,030, 2016 | 4 | 2016 |