| Design automation for IEEE P1687 FG Zadegan, U Ingelsson, G Carlsson, E Larsson Design, Automation & Test in Europe Conference & Exhibition (DATE), 2011, 1-6, 2011 | 77 | 2011 |
| A suite of IEEE 1687 benchmark networks A Tšertov, A Jutman, S Devadze, MS Reorda, E Larsson, FG Zadegan, ... Test Conference (ITC), 2016 IEEE International, 1-10, 2016 | 53 | 2016 |
| Access time analysis for IEEE P1687 FG Zadegan, U Ingelsson, G Carlsson, E Larsson IEEE Transactions on Computers 61 (10), 1459-1472, 2012 | 49 | 2012 |
| Test Scheduling in an IEEE P1687 Environment with Resource and Power Constraints FG Zadegan, U Ingelsson, G Asani, G Carlsson, E Larsson 2011 Asian Test Symposium, 525-531, 2011 | 40 | 2011 |
| On the testability of IEEE 1687 networks R Cantoro, M Montazeri, MS Reorda, FG Zadegan, E Larsson 2015 IEEE 24th Asian Test Symposium (ATS), 211-216, 2015 | 34 | 2015 |
| Design, Verification, and Application of IEEE 1687 FG Zadegan, E Larsson, A Jutman, S Devadze, R Krenz-Baath 2014 IEEE 23rd Asian Test Symposium, 93-100, 2014 | 33 | 2014 |
| Access time minimization in IEEE 1687 networks R Krenz-Baath, FG Zadegan, E Larsson Test Conference (ITC), 2015 IEEE International, 1-10, 2015 | 32 | 2015 |
| Reusing and Retargeting On-Chip Instrument Access Procedures in IEEE P1687 F Ghani Zadegan, U Ingelsson, E Larsson, G Carlsson Design & Test of Computers, IEEE 29 (2), 79-88, 2012 | 30 | 2012 |
| Test time analysis for IEEE P1687 FG Zadegan, U Ingelsson, G Carlsson, E Larsson 2010 19th IEEE Asian Test Symposium, 455-460, 2010 | 26 | 2010 |
| Accessing embedded DfT instruments with IEEE P1687 E Larsson, FG Zadegan 2012 IEEE 21st Asian Test Symposium, 71-76, 2012 | 21 | 2012 |
| Test of Reconfigurable Modules in Scan Networks R Cantoro, FG Zadegan, M Palena, P Pasini, E Larsson, MS Reorda IEEE Transactions on Computers, 2018 | 19 | 2018 |
| A Self-Reconfiguring IEEE 1687 Network for Fault Monitoring F Ghani Zadegan, D Nikolov, E Larsson European Test Symposium (ETS), 2016 | 17* | 2016 |
| Automatic generation of stimuli for fault diagnosis in IEEE 1687 networks R Cantoro, M Montazeri, M Sonza, FG Zadegan, E Larsson On-Line Testing and Robust System Design (IOLTS), 2016 IEEE 22nd …, 2016 | 16 | 2016 |
| Fault injection and fault handling: an MPSoC demonstrator using IEEE P1687 K Petersen, D Nikolov, U Ingelsson, G Carlsson, F Ghani Zadegan, ... 20th IEEE International On-Line Testing Symposium, 2014 | 15 | 2014 |
| On-Chip Fault Monitoring Using Self-Reconfiguring IEEE 1687 Networks FG Zadegan, D Nikolov, E Larsson IEEE Transactions on Computers 67 (2), 237-251, 2018 | 10 | 2018 |
| Upper-bound computation for optimal retargeting in IEEE1687 networks FG Zadegan, R Krenz-Baath, E Larsson Test Conference (ITC), 2016 IEEE International, 1-10, 2016 | 8 | 2016 |
| On the diagnostic analysis of IEEE 1687 networks R Cantoro, M Montazeri, MS Reorda, FG Zadegan, E Larsson Test Symposium (ETS), 2016 21th IEEE European, 1-2, 2016 | 6 | 2016 |
| Accessing on-chip instruments through the life-time of systems E Larsson, FG Zadegan 2016 17th Latin-American Test Symposium (LATS), 2-4, 2016 | 4 | 2016 |
| Robustness of TAP-based scan networks FG Zadegan, G Carlsson, E Larsson 2014 International Test Conference, 1-10, 2014 | 4 | 2014 |
| Reconfigurable On-Chip Instrument Access Networks: Analysis, Design, Operation, and Application F Ghani Zadegan The Department of Electrical and Information Technology, 2017 | 3* | 2017 |
Erik LarssonLunds UniversitetVerified email at eit.lth.se
