| Fabless-foundry partnership: Models and analysis of coordination issues A Chatterjee, D Gudmundsson, RK Nurani, S Seshadri, JG Shanthikumar IEEE transactions on semiconductor manufacturing 12 (1), 44-52, 1999 | 33 | 1999 |
| Tuning robotic part feeder parameters to maximize throughput D Gudmundsson, K Goldberg Assembly Automation 19 (3), 216-221, 1999 | 32 | 1999 |
| Oct. 1999.“Optimized Sample Planning for Wafer Defect Inspection,” Semiconductor Manufacturing Conference Proceedings R Williams, D Gudmundsson, K Monahan, R Nurani, M Stoller, ... 1999 IEEE International Symposium on Santa Clara, CA. Piscataway, NJ, 43-46, 0 | 29 | |
| Optimized sample planning for wafer defect inspection R Williams, D Gudmundsson, K Monahan, JG Shanthikumar Semiconductor Manufacturing Conference Proceedings, 1999 IEEE International …, 1999 | 25 | 1999 |
| Critical dimension sample planning for sub-0.25 micron processes RC Elliott, RK Nurani, D Gudmundsson, M Preil, R Nasongkhla, ... Advanced Semiconductor Manufacturing Conference and Workshop, 1999 IEEE/SEMI …, 1999 | 21 | 1999 |
| Challenging the paradigm of monitor reduction to achieve lower product costs R Williams, D Gudmundsson, R Nurani, M Stoller, A Chatterjee, ... Advanced Semiconductor Manufacturing Conference and Workshop, 1999 IEEE/SEMI …, 1999 | 18 | 1999 |
| A reticle quality management strategy in wafer fabs addressing progressive mask defect growth problem at low-k1 lithography K Bhattacharyya, K Son, BG Eynon Jr, D Gudmundsson, C Jaehnert, ... Photomask Technology, 89-97, 2004 | 15 | 2004 |
| Optimizing robotic part feeder throughput with queueing theory D Gudmundsson, K Goldberg Assembly Automation 27 (2), 134-140, 2007 | 14* | 2007 |
| Evaluating inspection strategies using advanced statistical methods RK Nurani, M Stoller, D Gudmundsson, JG Shanthikumar KLA-Tencor Yield Management Solutions 1 (3), 12-14, 1999 | 8 | 1999 |
| Improving the deployment of inspection tools; tutorial on inspection capacity and sample planning D Gudmundsson, JG Shanthikumar Semiconductor Manufacturing, 2005. ISSM 2005, IEEE International Symposium …, 2005 | 7 | 2005 |
| Integrated process and inspection/metrology capacity planning D Gudmundsson, JG Shanthikumar Semiconductor Manufacturing, 2005. ISSM 2005, IEEE International Symposium …, 2005 | 6 | 2005 |
| Estimating and optimizing throughput of a robotic part feeder using queueing theory D Gudmundsson, K Goldberg Intelligent Robots and Systems, 1998. Proceedings., 1998 IEEE/RSJ …, 1998 | 6 | 1998 |
| Inspection and metrology capacity allocation in the full production and ramp phases of semiconductor manufacturing D Gudmundsson Dissertation Abstracts International 68 (09), 2005 | 5 | 2005 |
| Cost effective reticle quality management strategies in wafer fabs V Samek, B Shiffler, W Tomlinson, D Gudmundsson, J Merritt, R Nurani, ... The 10th Annual IEEE/SEMI Advanced Semiconductor Manufacturing Conference …, 1999 | 4 | 1999 |
| 300mm fab automation can meet advanced defect detection needs R Spicer, D Gudmundsson, R Nurani Solid State Technology 44 (10), 54-62, 2001 | 3 | 2001 |
| Cost effective reticle quality management strategies in wafer fabs W Tomlinson, V Samek, B Shiffler, D Gudmundsson, J Merritt, RK Nurani, ... Advanced Semiconductor Manufacturing Conference and Workshop, 1999 IEEE/SEMI …, 1999 | 2 | 1999 |
| Comprehensive cost-effective photo defect monitoring strategy I Peterson, M Stoller, D Gudmundsson, R Nurani, S Ashkenaz, L Breaux Semiconductor Manufacturing Symposium, 2001 IEEE International, 67-70, 2001 | 1 | 2001 |
| Defect Sample Planning in 300 mm Fabs D Gudmundsson, N Narayanswami, R Nurani, A Sethuraman, M Shirey Yield Management Yield Management, 41, 2000 | | 2000 |
