Tim Dahmen
Title
Cited by
Cited by
Year
Realtime ray tracing for current and future games
J Schmittler, D Pohl, T Dahmen, C Vogelgesang, P Slusallek
ACM SIGGRAPH 2005 Courses, 23-es, 2005
392005
Feature adaptive sampling for scanning electron microscopy
T Dahmen, M Engstler, C Pauly, P Trampert, N De Jonge, F Mücklich, ...
Scientific reports 6 (1), 1-11, 2016
272016
Combined scanning transmission electron microscopy tilt-and focal series
T Dahmen, JP Baudoin, AR Lupini, C Kübel, P Slusallek, N De Jonge
Microscopy and Microanalysis 20 (2), 548-560, 2014
242014
How should a fixed budget of dwell time be spent in scanning electron microscopy to optimize image quality?
P Trampert, F Bourghorbel, P Potocek, M Peemen, C Schlinkmann, ...
Ultramicroscopy 191, 11-17, 2018
202018
Applying ray tracing for virtual reality and industrial design
I Wald, A Dietrich, C Benthin, A Efremov, T Dahmen, J Gunther, V Havran, ...
2006 IEEE Symposium on Interactive Ray Tracing, 177-185, 2006
202006
An automated workflow for the biomechanical simulation of a tibia with implant using computed tomography and the finite element method
T Dahmen, M Roland, T Tjardes, B Bouillon, P Slusallek, S Diebels
Computers & Mathematics with Applications 70 (5), 903-916, 2015
172015
Interactive headlight simulation: a case study of interactive distributed ray tracing
C Benthin, T Dahmen, I Wald, P Slusallek
ACM International Conference Proceeding Series 29, 83-88, 2002
172002
The Ettention software package
T Dahmen, L Marsalek, N Marniok, B Turoňová, S Bogachev, P Trampert, ...
Ultramicroscopy 161, 110-118, 2016
152016
Interactive Headlight Simulation–A Case Study of Distributed Interactive Ray Tracing
C Benthin, I Wald, T Dahmen, P Slusallek
Proceedings of the 4th Eurographics Workshop on Parallel Graphics and …, 2002
142002
Exemplar-based inpainting as a solution to the missing wedge problem in electron tomography
P Trampert, W Wang, D Chen, RBG Ravelli, T Dahmen, PJ Peters, ...
Ultramicroscopy 191, 1-10, 2018
102018
Exemplar-based inpainting based on dictionary learning for sparse scanning electron microscopy
P Trampert, S Schlabach, T Dahmen, P Slusallek
Microscopy and Microanalysis 24 (S1), 700-701, 2018
82018
High-throughput large volume SEM workflow using sparse scanning and in-painting algorithms inspired by compressive sensing
F Boughorbel, P Potocek, M Hovorka, L Strakos, J Mitchels, T Vystavel, ...
Microscopy and Microanalysis 23 (S1), 150-151, 2017
82017
Matched backprojection operator for combined scanning transmission electron microscopy tilt-and focal series
T Dahmen, H Kohr, N de Jonge, P Slusallek
Microscopy and Microanalysis 21 (3), 725-738, 2015
82015
Less than full circumferential fusion of a tibial nonunion is sufficient to achieve mechanically valid fusion-Proof of concept using a finite element modeling approach
T Tjardes, M Roland, R Otchwemah, T Dahmen, S Diebels, B Bouillon
BMC musculoskeletal disorders 15 (1), 1-7, 2014
82014
Linear chains of HER2 receptors found in the plasma membrane using liquid-phase electron microscopy
K Parker, P Trampert, V Tinnemann, D Peckys, T Dahmen, N de Jonge
Biophysical journal 115 (3), 503-513, 2018
72018
Digital reality: a model-based approach to supervised learning from synthetic data
T Dahmen, P Trampert, F Boughorbel, J Sprenger, M Klusch, K Fischer, ...
AI Perspectives 1 (1), 1-12, 2019
62019
Modelling and characterization of ductile fracture surface in Al-Si alloys by means of Voronoi tessellation
A Kruglova, M Roland, S Diebels, T Dahmen, P Slusallek, F Mücklich
Materials Characterization 131, 1-11, 2017
62017
A ray tracing based virtual reality framework for industrial design
I Wald, C Benthin, A Efremov, T Dahmen, J Gunther, A Dietrich, V Havran, ...
SCI Institute-University of Utah-Technical Report number UUSCI-2005-009 …, 2005
62005
A ray tracing based framework for high-quality virtual reality in industrial design applications
I Wald, C Benthin, A Efremov, T Dahmen, J Guenther, A Dietrich, ...
submitted for publication, 2005
62005
Dictionary-based Filling of the Missing Wedge in Electron Tomography
P Trampert, D Chen, S Bogachev, T Dahmen, P Slusallek
Microscopy and Microanalysis 22 (S3), 554-555, 2016
52016
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Articles 1–20