| Effective scalable IEEE 1687 instrumentation network for fault management A Jutman, S Devadze, K Shibin IEEE Design & Test 30 (5), 26-35, 2013 | 37 | 2013 |
| Asynchronous fault detection in IEEE P1687 instrument network K Shibin, S Devadze, A Jutman 2014 IEEE 23rd North Atlantic Test Workshop, 73-78, 2014 | 21 | 2014 |
| Health management for self-aware socs based on ieee 1687 infrastructure K Shibin, S Devadze, A Jutman, M Grabmann, R Pricken IEEE Design & Test 34 (6), 27-35, 2017 | 16 | 2017 |
| Reliable health monitoring and fault management infrastructure based on embedded instrumentation and IEEE 1687 A Jutman, K Shibin, S Devadze 2016 IEEE AUTOTESTCON, 1-10, 2016 | 16 | 2016 |
| On-line fault classification and handling in IEEE1687 based fault management system for complex SoCs K Shibin, S Devadze, A Jutman 2016 17th Latin-American Test Symposium (LATS), 69-74, 2016 | 16 | 2016 |
| System and method for optimized board test and configuration S Devadze, A Jutman, I Aleksejev, K Shibin, T Wenzel US Patent 9,164,858, 2015 | 14 | 2015 |
| IEEE 1687 compliant ecosystem for embedded instrumentation access and in-field health monitoring A Tsertov, A Jutman, K Shibin, S Devadze 2018 IEEE AUTOTESTCON, 1-9, 2018 | 7 | 2018 |
| Designing reliable cyber-physical systems G Aleksandrowicz, E Arbel, R Bloem, TD ter Braak, S Devadze, G Fey, ... Languages, Design Methods, and Tools for Electronic System Design: Selected …, 2018 | 7 | 2018 |
| Virtual reconfigurable scan-chains on FPGAs for optimized board test I Aleksejev, S Devadze, A Jutman, K Shibin 2015 16th Latin-American Test Symposium (LATS), 1-6, 2015 | 6 | 2015 |
| Understanding fault-tolerance vulnerabilities in advanced SoC FPGAs for critical applications N Cherezova, K Shibin, M Jenihhin, A Jutman Microelectronics Reliability 146, 115010, 2023 | 2 | 2023 |
| On-Chip Sensors Data Collection and Analysis for SoC Health Management K Shibin, M Jenihhin, A Jutman, S Devadze, A Tsertov 2023 IEEE International Symposium on Defect and Fault Tolerance in VLSI and …, 2023 | 1 | 2023 |
| Designing reliable cyber-physical systems overview associated to the special session at FDL'16 G Aleksandrowicz, E Arbel, R Bloem, T Ter Braak, S Devadze, G Fey, ... 2016 Forum on Specification and Design Languages (FDL), 1-8, 2016 | 1 | 2016 |
| Optimization of Boundary Scan Tests Using FPGA-Based Efficient Scan Architectures I Aleksejev, S Devadze, A Jutman, K Shibin Journal of Electronic Testing 32, 245-255, 2016 | 1 | 2016 |
| Open-Source JTAG Simulator Bundle for Labs K Shibin, S Devadze, V Rosin, A Jutman, R Ubar International Journal of Electronics and Telecommunications 58, 233-239, 2012 | | 2012 |
| Trainer 1149: a Boundary Scan Simulation Bundle for Labs A Jutman, R Ubar, S Devadze, K Shibin, V Rosin Proceedings of the 18th International Conference Mixed Design of Integrated …, 2011 | | 2011 |
| Understanding Boundary Scan Test with Trainer 1149 A Jutman, R Ubar, S Devadze, K Shibin, V Rosin 2011 Proceedings of the 22nd EAEEIE Annual Conference (EAEEIE), 1-6, 2011 | | 2011 |
| IEEE P1687 IJTAG demonstrator on FPGA K Shibin, I Aleksejev, A Jutman, S Devadze | | |
| Fault Management Instrumentation Network based on IEEE P1687 IJTAG K Shibin, A Jutman, S Devadze | | |
